المؤلفون: Heng, J.B., Dimitrov, V., Grinkova, Y.V., Ho, C., Kim, T., Muller, D., Sligar, S., Sorsch, T., Twesten, R., Timp, R., Timp, G.

المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :32.2.1-32.2.4 2003

Relation: IEEE International Electron Devices Meeting 2003

المؤلفون: Thomas, P. J.^Aff3, Booth, C.^Aff3, Harmon, R.^Aff3, Markovic, S.^Aff3, Twesten, R. D.^Aff3, Jarausch, K.^Aff4

المساهمون: Luysberg, Martina, editor^Aff1, Tillmann, Karsten, editor^Aff1, Weirich, Thomas, editor^Aff2

المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :445-446

المؤلفون: Jarausch, K.^Aff3, Leonard, D.^Aff4, Twesten, R.^Aff5, Thomas, P.^Aff5

المساهمون: Luysberg, Martina, editor^Aff1, Tillmann, Karsten, editor^Aff1, Weirich, Thomas, editor^Aff2

المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :317-318

المؤلفون: Twesten, R. D.^Aff3, Thomas, P. J.^Aff3, Inada, H.^Aff4, Zhu, Y.^Aff5

المساهمون: Luysberg, Martina, editor^Aff1, Tillmann, Karsten, editor^Aff1, Weirich, Thomas, editor^Aff2

المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :233-234

المؤلفون: Inada, H.^Aff3, Zhu, Y.^Aff4, Wall, J.^Aff4, Volkov, V.^Aff4, Nakamura, K.^Aff5, Konno, M.^Aff5, Kaji, K.^Aff5, Jarausch, K.^Aff3, Twesten, R. D.^Aff6

المساهمون: Luysberg, Martina, editor^Aff1, Tillmann, Karsten, editor^Aff1, Weirich, Thomas, editor^Aff2

المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany : Volume 1: Instrumentation and Methods. :31-32

المؤلفون: Zhang, M., Olson, E. A., Twesten, R. D., Wen, J. G., Allen, L. H., Robertson, I. M., Petrov, I.^Aff119

المصدر: Journal of Materials Research. 20(7):1802-1807

المؤلفون: Kirk, M. A., Davidson, R. S., Jenkins, M. L., Twesten, R. D.

المصدر: MRS Online Proceedings Library. 792(1):85-90

المؤلفون: Follstaedt, D. M., Lee, S. R., Reno, J. L., Jones, E. D., Twesten, R. D., Norman, A. G., Ahrenkiel, S. P., Moutinho, H. R., Mascarenhas, A., Millunchick, J. Mirecki

المصدر: MRS Online Proceedings Library. 583(1):333-347

المؤلفون: Lee, S. R., Millunchick, J. Mirecki, Twesten, R. D., Follstaedt, D. M., Reno, J. L., Ahrenkiel, S. P., Norman, A. G.

المصدر: Journal of Materials Science: Materials in Electronics. May 1999 10(3):191-197

المؤلفون: Floro, J. A., Chason, E., Lee, S. R., Twesten, R. D., Hwang, R. Q., Freund, L. B.

المصدر: Journal of Electronic Materials. 26(9):969-979