المؤلفون: Chen, Don C.L., Tzeng, J.T., Scott, David B., Peng, S.W., Shen, M.H., Sio, K.T., Narayanasetti, Praneeth

المصدر: 2013 IEEE International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2013 IEEE International Conference on. :1008-1015 Aug, 2013

Relation: 2013 IEEE International Conference on Automation Science and Engineering (CASE 2013)

المؤلفون: Yang, S.H., Sheu, J.Y., Ieong, M.K., Chiang, M.H., Yamamoto, T., Liaw, J.J., Chang, S.S., Lin, Y.M., Hsu, T.L., Hwang, J.R., Ting, J.K., Wu, C.H., Ting, K.C., Yang, F.C., Liu, C.M., Wu, I.L., Chen, Y.M., Chent, S.J., Chen, K.S., Cheng, J.Y., Tsai, M.H, Chang, W., Chen, R., Chen, C.C., Lee, T.L., Lin, C.K, Yang, S.C., Sheu, Y.M., Tzeng, J.T., Lu, L.C., Jang, S.M, Diaz, C.H., Mii, YJ

المصدر: 2011 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2011 IEEE. :1-5 Sep, 2011

Relation: 2011 IEEE Custom Integrated Circuits Conference - CICC 2011

المؤلفون: Tzeng, J.T.

المصدر: 2004 12th Symposium on Electromagnetic Launch Technology Electromagnetic Launch Technology Electromagnetic Launch Technology, 2004. 2004 12th Symposium on. :127-132 2004

Relation: 2004 12th Symposium on Electromagnetic Launch Technology

المؤلفون: Cheng, C.C., Lin, J.F., Wang, T., Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 6(3):358-363 Sep, 2006

المؤلفون: Tzeng, J.T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 41(1):246-250 Jan, 2005

المؤلفون: Tzeng, J.T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 39(1):384-388 Jan, 2003

المؤلفون: Tzeng, J.T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 39(1):472-475 Jan, 2003

المؤلفون: Tzeng, J.T.

المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 37(1):328-331 Jan, 2001

المؤلفون: Cheng, Chih-Chang, Lin, J.F., Wang, Tahui, Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, Samuel C., Hsu, S.L.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :881-884 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Cheng, C.C., Tu, K.C., Wang, T., Hsieh, T.H., Tzeng, J.T., Jong, Y.C., Liou, R.S., Pan, S.C., Hsu, S.L.

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :334-337 Mar, 2006

Relation: 2006 IEEE International Reliability Physics Symposium Proceedings