المؤلفون: Insinga, G., Battilana, M., Coppetta, M., Mautone, N., Carnevale, G., Giltrelli, M., Scaramuzza, P., Ullmann, R.

المصدر: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023

Relation: 2023 IEEE European Test Symposium (ETS)

المؤلفون: Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Reorda, M.S., Ullmann, R., Vanhooren, R., Xama, N., Wu, L.

المصدر: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2022 IEEE 28th International Symposium on. :1-10 Sep, 2022

Relation: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Bernardi, P., Insinga, G., Paganini, G., Cantoro, R., Beer, P., Coppetta, M., Mautone, N., Carnevale, G., Scaramuzza, P., Ullmann, R.

المصدر: 2022 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2022 IEEE European. :1-6 May, 2022

Relation: 2022 IEEE European Test Symposium (ETS)

المؤلفون: Abbati, L. Degli, Ullmann, R., Paganini, G., Coppetta, M., Zaia, L., Huard, V., Montfort, O., Cantoro, R., Insinga, G., Venini, F., Calao, P., Bernardi, P.

المصدر: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2021 IEEE International Symposium on. :1-6 Oct, 2021

Relation: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Manzini, A., Inglese, P., Caldi, L., Cantoro, R., Carnevale, G., Coppetta, M., Giltrelli, M., Mautone, N., Irrera, F., Ullmann, R., Bernardi, P.

المصدر: 2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-6 May, 2019

Relation: 2019 IEEE European Test Symposium (ETS)

المؤلفون: Backhausen, U., Ballan, O., Bemardi, P., De Luca, S., Henzler, J., Kern, T., Piumatti, D., Rabenalt, T., Ramamoorthy, K.C., Sanchez, E., Sansonetti, A., Ullmann, R., Venini, F., Wiesner, R.

المصدر: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2017 IEEE 23rd International Symposium on. :157-162 Jul, 2017

Relation: 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

المؤلفون: Ullmann, R., Magimai-Doss, M., Bourlard, H.

المصدر: 2015 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) Acoustics, Speech and Signal Processing (ICASSP), 2015 IEEE International Conference on. :4924-4928 Apr, 2015

Relation: ICASSP 2015 - 2015 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)

المؤلفون: Shum, D., Power, J. R., Ullmann, R., Suryaputra, E., Ho, K., Hsiao, J., Tan, C. H., Langheinrich, W., Bukethal, C., Pissors, V., Tempel, G., Rohrich, M., Gratz, A., Iserhagen, A., Andersen, E. O., Paprotta, S., Dickenscheid, W., Strenz, R., Duschl, R., Kern, T., Hsieh, C. T., Huang, C. M., Ho, C. W., Kuo, H. H., Hung, C. W., Lin, Y. T., Tran, L. C.

المصدر: 2012 4th IEEE International Memory Workshop Memory Workshop (IMW), 2012 4th IEEE International. :1-4 May, 2012

Relation: 2012 4th IEEE International Memory Workshop (IMW)

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المؤلفون: Zambelli, C., Koebernik, G., Ullmann, R., Bauer, M., Tempel, G., Di Tano, F., Atti, M., Pistone, F. P., Siviero, A., Olivo, P.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 14(1):66-73 Mar, 2014