يعرض 1 - 10 نتائج من 82 نتيجة بحث عن '"Uemura, Taiki"', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    مؤتمر
    Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Choi, Jaehee, Lee, Seungbae, Chung, Shinyoung, Hwang, Yuchul, Pae, Sangwoo

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  2. 2
    مؤتمر
    Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Choi, Jaehee, Lee, Seungbae, Chung, Shinyoung, Hwang, Yuchul, Pae, Sangwoo

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  3. 3
    مؤتمر
    Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Chung, Shinyoung, Lee, Seungbae, Hwang, Yuchul, Pae, Sangwoo

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk

    المؤلفون: Rhee, Sungman, Kim, Hyunjin, Park, Sangku, Uemura, Taiki, Hwang, Yuchul, Choo, Seungjin, Kim, Jinju, Rhee, Hwasung, Chung, Shinyoung

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-4 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  5. 5
    مؤتمر
    Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Kim, Mijoung, Lee, Dalhee, Kim, Gunrae, Lee, Seungbae, Song, Taesjoong, Rhee, Hwasung, Lee, Brandon, Choi, Jaehee

    المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-7 Mar, 2021

    Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

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  6. 6
    مؤتمر
    Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology

    المؤلفون: Jiang, Hai, Sagong, Hyunchul, Kim, Jinju, Shim, Hyewon, Kim, Yoohwan, Park, Junekyun, Uemura, Taiki, Ji, Yongsung, Jeong, Taeyoung, Kwon, Dongkyun, Rhee, Hwasung, Pae, Sangwoo, Lee, Brandon

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  7. 7
    مؤتمر
    Reliability on EUV Interconnect Technology for 7nm and beyond

    المؤلفون: Jeong, Tae-Young, Lee, Miji, Jo, Yunkyung, Kim, Jinwoo, Kim, Min, Yeo, Myungsoo, Kim, Jinseok, Choi, Hyunjun, Kim, Joosung, Jo, Yoojin, Ji, Yongsung, Uemura, Taiki, Jiang, Hai, Kwon, Dongkyun, Rhee, HwaSung, Pae, Sangwoo, Lee, Brandon

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  8. 8
    مؤتمر
    Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Jiang, Hai, Ji, Yongsung, Jeong, Tae-Young, Ranjan, Rakesh, Lee, Seungbae, Rhee, Hwasung, Pae, Sangwoo, Lee, Euncheol, Choi, Jaehee, Ohnishi, Shota, Machida, Ken

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  9. 9
    مؤتمر
    Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET

    المؤلفون: Uemura, Taiki, Chung, Byungjin, Jo, Jeongmin, Jiang, Hai, Ji, Yongsung, Jeong, Tae-Young, Ranjan, Rakesh, Park, Youngin, Hong, Kiil, Lee, Seungbae, Rhee, Hwasung, Pae, Sangwoo, Lee, Euncheol, Choi, Jaehee, Ohnishi, Shota, Machida, Ken

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  10. 10
    مؤتمر
    SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET

    المؤلفون: Uemura, Taiki, Lee, Soonyoung, Min, Dahye, Moon, Ihlhwa, Lee, Seungbae, Pae, Sangwoo

    المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019

    Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

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