-
1
المؤلفون: Jae Hyeon Park, Chan Hee Suk, Sungchul Kim, Jae Ho Kim, Uihui Kwon, Dae Sin Kim, Keon-Ho Yoo, Tae Whan Kim
المصدر: IEEE Electron Device Letters. 43:1697-1700
-
2مؤتمر
المؤلفون: Kwan-Yong Lim, Hyunjung Lee, Choongryul Ryu, Kang-Ill Seo, Uihui Kwon, Seokhoon Kim, Jongwan Choi, Kyungseok Oh, Hee-Kyung Jeon, Chulgi Song, Tae-Ouk Kwon, Jinyeong Cho, Seunghun Lee, Yangsoo Sohn, Hong Sik Yoon, Junghyun Park, Kwanheum Lee, Wookje Kim, Eunha Lee, Sang-Pil Sim, Chung Geun Koh, Sang Bom Kang, Siyoung Choi, Chilhee Chung
المصدر: 2010 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2010 IEEE International. :10.1.1-10.1.4 Dec, 2010
Relation: 2010 IEEE International Electron Devices Meeting (IEDM)
-
3
المؤلفون: Hiroki Fujii, Jaehyun Yoo, Dawon Jeong, Seongsik Min, Myoungsoo Kim, Uihui Kwon, Dae Sin Kim
المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::497e7e169a3d4fc9b9c7c049e09b3d31
https://doi.org/10.1109/essderc55479.2022.9947095 -
4
المؤلفون: Kantawong Vuttivorakulchai, Mohammad Ali Pourghaderi, Gwang-Jun Kim, Seunghyun Song, Yoon-Suk Kim, Uihui Kwon, Dae Sin Kim
المصدر: Solid-State Electronics. 201:108583
مصطلحات موضوعية: Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
-
5
المؤلفون: Wook Lee, Seonghoon Ko, Jae Ho Kim, Yoon-Suk Kim, Uihui Kwon, HyunChul Kim, Dae Sin Kim
المصدر: Solid-State Electronics. 198:108472
مصطلحات موضوعية: Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials
-
6
المؤلفون: Yoon-Suk Kim, Uihui Kwon, Dae Sin Kim, Jaehyun Yoo, Yong-Hee Park
المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
مصطلحات موضوعية: Standard cell, Process modeling, Opportunity cost, business.industry, Computer science, Semiconductor device fabrication, Hardware_PERFORMANCEANDRELIABILITY, Reliability engineering, New product development, MOSFET, Hardware_INTEGRATEDCIRCUITS, Node (circuits), Architecture, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::81530404e98d84e4be7bbd7694558b8e
https://doi.org/10.1109/sispad54002.2021.9592554 -
7
المؤلفون: Marton Voros, Seonghoon Jin, Dae Sin Kim, Woosung Choi, Yong-Hee Park, Kantawong Vuttivorakulchai, Uihui Kwon, Mohammad Ali Pourghaderi, Byounghak Lee
المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
مصطلحات موضوعية: chemistry.chemical_compound, Materials science, chemistry, Impurity, Extraction (chemistry), Autocorrelation, Surface roughness, Oxide, chemistry.chemical_element, First principle, Germanium, Surface finish, Composite material
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7309c01dbd04466845bfe4e015b87f71
https://doi.org/10.1109/sispad54002.2021.9592577 -
8
المؤلفون: Sungchul Kim, Dae Sin Kim, Uihui Kwon, Jae-ho Kim, Kyung-Ho Lee
المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
مصطلحات موضوعية: Materials science, Planar, Pixel, business.industry, Transfer (computing), Logic gate, Semiconductor device modeling, Optoelectronics, Electric potential, Image sensor, business, Signal
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d35a1df9ad73312e9074b5d43f8e7bd8
https://doi.org/10.1109/sispad54002.2021.9592568 -
9
المؤلفون: Dawon Jung, Dae Sin Kim, Kyu-ok Lee, Yongwoo Jeon, Yong-Don Kim, UiHui Kwon, Jaehyun Yoo, Kwangtae Kim, Oh-Kyum Kwon, Jeahyun Jung, Junhyuk Kim, Jisu Ryu
المصدر: 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
مصطلحات موضوعية: 010302 applied physics, Computer science, Process development, 020208 electrical & electronic engineering, 02 engineering and technology, Integrated circuit, 01 natural sciences, Turnaround time, Process conditions, law.invention, Ion implantation, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Optimization methods
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7f7aca98c8125f7ae612e7bb961186bd
https://doi.org/10.23919/ispsd50666.2021.9452285 -
10
المؤلفون: Jaehyun Yoo, Junhyeok Kim, Yoon-Suk Kim, Kwangtea Kim, Uihui Kwon, Jaehyun Jung, Jaehyun Bae, Daesin Kim, Oh-Kyum Kwon
المصدر: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
مصطلحات موضوعية: LDMOS, Process modeling, Computer science, business.industry, Stability (learning theory), Process (computing), Statistical model, Hardware_PERFORMANCEANDRELIABILITY, Statistical process control, Machine learning, computer.software_genre, Hardware_INTEGRATEDCIRCUITS, Wafer, Artificial intelligence, business, Low voltage, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::175a27a9e70cd8f5ff6004c08e037fdf
https://doi.org/10.23919/sispad49475.2020.9241590