يعرض 1 - 10 نتائج من 212 نتيجة بحث عن '"Underwood, Ian"', وقت الاستعلام: 0.83s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

    Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

  2. 2
    مؤتمر

    المصدر: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2023 IEEE 36th International. :183-185 Jul, 2023

    Relation: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)

  3. 3
    مؤتمر

    المصدر: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2023 IEEE 36th International. :230-232 Jul, 2023

    Relation: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)

  4. 4
    مؤتمر

    المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022

    Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

  5. 5
    مؤتمر

    المؤلفون: Bulling, Anthony F., Underwood, Ian

    المصدر: 2019 IEEE SENSORS SENSORS, 2019 IEEE. :1-4 Oct, 2019

    Relation: 2019 IEEE SENSORS

  6. 6
    مؤتمر

    المؤلفون: Bulling, Anthony F., Underwood, Ian

    المصدر: 2018 IEEE SENSORS SENSORS, 2018 IEEE. :1-4 Oct, 2018

    Relation: 2018 IEEE SENSORS

  7. 7
    مؤتمر

    المصدر: 2018 IEEE SENSORS SENSORS, 2018 IEEE. :1-4 Oct, 2018

    Relation: 2018 IEEE SENSORS

  8. 8
  9. 9
    مؤتمر

    المصدر: 2016 IEEE Region 10 Conference (TENCON) Region 10 Conference (TENCON), 2016 IEEE. :3394-3397 Nov, 2016

    Relation: TENCON 2016 - 2016 IEEE Region 10 Conference

  10. 10
    مؤتمر

    المصدر: 2017 IEEE SENSORS SENSORS, 2017 IEEE. :1-3 Oct, 2017

    Relation: 2017 IEEE SENSORS