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1مؤتمر
المؤلفون: Kim, S. H., Yokoyama, M., Taoka, N., Iida, R., Lee, S., Nakane, R., Urabe, Y., Miyata, N., Yasuda, T., Yamada, H., Fukuhara, N., Hata, M., Takenaka, M., Takagi, S.
المصدر: IPRM 2011 - 23rd International Conference on Indium Phosphide and Related Materials Compound Semiconductor Week (CSW/IPRM), 2011 and 23rd International Conference on Indium Phosphide and Related Materials. :1-4 May, 2011
Relation: 2011 Compound Semiconductor Week (CSW) & 23rd International Conference on Indium Phosphide and Related Materials (IPRM)
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2دورية أكاديمية
المؤلفون: Kim, S., Yokoyama, M., Taoka, N., Iida, R., Lee, S.-H., Nakane, R., Urabe, Y., Miyata, N., Yasuda, T., Yamada, H., Fukuhara, N., Hata, M., Takenaka, M., Takagi, S.
المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 12(4):621-628 Jul, 2013
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3دورية أكاديمية
Alternate Title: Examen de la charge d’exercice pour la récupération de la force musculaire réduite via un étirement statique (French)
المؤلفون: Yamamoto, T., Urabe, Y., Maeda, N.
المصدر: In Science et Sports October 2020 35(5):e148-e155
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4مؤتمر
المؤلفون: Takai, H., Urabe, Y., Yamasaki, H.
المصدر: Proceedings of IEEE Vehicular Technology Conference (VTC) Vehicular technology Vehicular Technology Conference, 1994 IEEE 44th. :1355-1359 vol.2 1994
Relation: Proceedings of IEEE Vehicular Technology Conference (VTC)
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5دورية أكاديمية
المؤلفون: Yokoyama, M., Iida, R., Kim, S., Taoka, N., Urabe, Y., Takagi, H., Yasuda, T., Yamada, H., Fukuhara, N., Hata, M., Sugiyama, M., Nakano, Y., Takenaka, M., Takagi, S.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(9):1218-1220 Sep, 2011
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6مؤتمر
المؤلفون: Yokoyama, M., Kim, S. H., Zhang, R., Taoka, N., Urabe, Y., Maeda, T., Takagi, H., Yasuda, T., Yamada, H., Ichikawa, O., Fukuhara, N., Hata, M., Sugiyama, M., Nakano, Y., Takenaka, M., Takagi, S.
المصدر: 2011 Symposium on VLSI Technology - Digest of Technical Papers VLSI Technology (VLSIT), 2011 Symposium on. :60-61 Jun, 2011
Relation: 2011 IEEE Symposium on VLSI Technology
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7مؤتمر
المؤلفون: Kim, S. H., Yokoyama, M., Taoka, N., Iida, R., Lee, S., Nakane, R., Urabe, Y., Miyata, N., Yasuda, T., Yamada, H., Fukuhara, N., Hata, M., Takenaka, M., Takagi, S.
المصدر: 2011 Symposium on VLSI Technology - Digest of Technical Papers VLSI Technology (VLSIT), 2011 Symposium on. :58-59 Jun, 2011
Relation: 2011 IEEE Symposium on VLSI Technology
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8مؤتمر
المؤلفون: Maeda, T., Urabe, Y., Itatani, T., Ishii, H., Miyata, N., Yasuda, T., Yamada, H., Hata, M., Yokoyama, M., Takenaka, M., Takagi, S.
المصدر: 2011 Symposium on VLSI Technology - Digest of Technical Papers VLSI Technology (VLSIT), 2011 Symposium on. :62-63 Jun, 2011
Relation: 2011 IEEE Symposium on VLSI Technology
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9مؤتمر
المؤلفون: Yokoyama, M., Urabe, Y., Yasuda, T., Takagi, H., Ishii, H., Miyata, N., Yamada, H., Fukuhara, N., Hata, M., Sugiyama, M., Nakano, Y., Takenaka, M., Takagi, S.
المصدر: 2010 Symposium on VLSI Technology VLSI Technology (VLSIT), 2010 Symposium on. :235-236 Jun, 2010
Relation: 2010 IEEE Symposium on VLSI Technology
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10مؤتمر
المؤلفون: Yokoyama, M., Iida, R., Kim, S. H., Taoka, N., Urabe, Y., Yasuda, T., Takagi, H., Yamada, H., Fukuhara, N., Hata, M., Sugiyama, M., Nakano, Y., Takenaka, M., Takagi, S.
المصدر: 2010 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2010 IEEE International. :3.1.1-3.1.4 Dec, 2010
Relation: 2010 IEEE International Electron Devices Meeting (IEDM)