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1
المؤلفون: Yi Lee, Uwe Paul Schroeder, Pouya Rezaeifakhr, Lynn T. Wang, David Villarreal
المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::13bcd1ff869bd72b2e5849419d6c4002
https://doi.org/10.1117/12.2657156 -
2
المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e3e70f40fbc60432a3b543006f2901ca
https://doi.org/10.1117/12.2659397 -
3
المؤلفون: Lynn T. N. Wang, Klaus-Peter Johnsen, Ivan Tanev, Fadi Batarseh, Chang Su, Pouya Rezaeifakhr, Uwe Paul Schroeder
المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea2ee437179c5938d9cd6e589f249426
https://doi.org/10.1117/12.2658646 -
4
المؤلفون: Jonathan Fales, Binod Kumar G. Nair, Jeffrey E. Nelson, Frank E. Gennari, Philippe Hurat, Jac Condella, Akif Sultan, Aaron Sinnott, Xiaoyuan Qi, Sriram Madhavan, Uwe Paul Schroeder, Rwik Sengupta, Ya-Chieh Lai
المصدر: IEEE Transactions on Semiconductor Manufacturing. 34:372-378
مصطلحات موضوعية: Computer science, Process (engineering), Yield (finance), Semiconductor device modeling, Critical area, Integrated circuit, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Reliability engineering, law.invention, law, Range (statistics), Electrical and Electronic Engineering, Failure mode and effects analysis, Scaling
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5
المؤلفون: Lynn T. N. Wang, Uwe Paul Schroeder, Punitha Selvam, Fadi Salameh Batarseh, Pouya Rezaeifakhr, Ariel de Jesus Reyes Ruiz, Teodora Nicolae, Ivan Tanev, Sriram Madhavan
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0294b0817b7f623bad62e21463b51049
https://doi.org/10.1117/12.2614460 -
6
المؤلفون: Fadi Salameh Batarseh, Uwe Paul Schroeder, Jeff Nelson, Piyush Pathak, Wei-Long Wang, Ya-Chieh Lai
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c39c51395aa20f214d9c1e1aabc2cfe
https://doi.org/10.1117/12.2617261 -
7
المؤلفون: Suraag S. Tellakula, Uwe Paul Schroeder, Janam Bakshi, Punitha Selvam, Pouya Rezaeifakhr, Sriram Madhavan
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::03781103a9108b123ccf1e2d6ffa9f09
https://doi.org/10.1117/12.2613828 -
8
المؤلفون: Piyush Pathak, Uwe Paul Schroeder, Fadi Batarseh, Philippe Hurat, Jeffrey E. Nelson, Sriram Madhavan, Ya-Chieh Lai
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Similarity (network science), Computer science, Metric (mathematics), Pattern matching, Semi-supervised learning, Approximate string matching, Physical design, Cluster analysis, Algorithm, Ranking (information retrieval)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40d43d18d5b04c9fb948289250bf8f06
https://doi.org/10.1117/12.2586112 -
9
المؤلفون: David Villarreal, Uwe Paul Schroeder, Janam Bakshi
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Artificial neural network, business.industry, Computer science, Computation, Machine learning, computer.software_genre, Chip, Measure (mathematics), Design for manufacturability, Limit (music), Retargeting, Node (circuits), Artificial intelligence, business, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::701933d88c550ab1201adeee3db97e3f
https://doi.org/10.1117/12.2582844 -
10
المؤلفون: Rais Huda, Zhao Chuan Lee, Sriram Madhavan, Michael Simcoe, Uwe Paul Schroeder, Vikas Mehrotra, Lynn T.-N. Wang, Mckay Thomas G
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Analogue electronics, Computer science, Parasitic element, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Schematic, Topology (electrical circuits), Hardware_PERFORMANCEANDRELIABILITY, Routing (electronic design automation), Network topology, Capacitance, Design for manufacturability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1c94d00d01d3ce407d3ceaba4c9dfc59
https://doi.org/10.1117/12.2583839