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المؤلفون: V. Basker, Kai Zhao, Maruf Bhuiyan, Balasubramanian S. Pranatharthi Haran, Huimei Zhou, Nicolas Loubet, Miaomiao Wang, James Chingwei Li, Shogo Mochizuki, E. Stuckert, Huiming Bu, Jingyun Zhang, Dechao Guo
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Electron mobility, Materials science, Silicon, business.industry, chemistry.chemical_element, Germanium, Epitaxy, Subthreshold slope, Silicon-germanium, chemistry.chemical_compound, Compressive strength, chemistry, Optoelectronics, business, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3922c2082657b9b57e882355387b1b91
https://doi.org/10.1109/iedm13553.2020.9372041 -
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المؤلفون: Jing Guo, Balasubramanian S. Pranatharthi Haran, Miaomiao Wang, Paul C. Jamison, V. Basker, James Chingwei Li, Richard G. Southwick, Vijay Narayanan, Shanti Pancharatnam, Dechao Guo, Muthumanickam Sankarapandian, Nicolas Loubet, Ruqiang Bao, Huimei Zhou, Huiming Bu, Koji Watanabe, Mukesh Khare, Jingyun Zhang, James J. Demarest
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, chemistry.chemical_element, Compensation (engineering), Threshold voltage, law.invention, Reduction (complexity), Dipole, chemistry, law, Logic gate, Optoelectronics, business, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0325658de271cb045bd8e65882c029ed
https://doi.org/10.1109/vlsitechnology18217.2020.9265010 -
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المؤلفون: Hosadurga Shobha, Tenko Yamashita, Chanro Park, Huiming Bu, R. Divakaruni, V. Basker, C. Adams, Dechao Guo, Jingyun Zhang, Lan Yu, Pietro Montanini, X.-H. Liu, A. Arceo De La Pena, Frougier Julien, Kai Zhao, Ruqiang Bao, Robert R. Robison, Nicolas Loubet, Balasubramanian S. Pranatharthi Haran, Muthumanickam Sankarapandian, Xin Miao, James Chingwei Li, Richard A. Conti, Tian Shen, Junli Wang, Praveen Joseph, Huimei Zhou, Koji Watanabe, Reinaldo A. Vega, Shanti Pancharatnam, Ruilong Xie, Curtis Durfee, A. Gaul, Daniel J. Dechene, Andrew M. Greene, Robin Chao, Dexin Kong, Heng Wu
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Dielectric isolation, Materials science, 010308 nuclear & particles physics, business.industry, Effective capacitance, Transistor, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, Process variation, law, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Nanosheet, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::04eec01ea9d2193f3390c42bab98c01a
https://doi.org/10.1109/iedm19573.2019.8993490 -
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المؤلفون: Miaomiao Wang, Huimei Zhou, Alex Hubbard, Paul C. Jamison, Balasubramanian S. Pranatharthi Haran, Huiming Bu, Ruqiang Bao, Jing Guo, V. Basker, A. Gaul, Mukesh Khare, Nicolas Loubet, Koji Watanabe, James Chingwei Li, Daniel J. Dechene, Dechao Guo, Reinaldo A. Vega, Muthumanickam Sankarapandian, Shanti Pancharatnam, Jingyun Zhang
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Computer science, 02 engineering and technology, 021001 nanoscience & nanotechnology, Supercomputer, 01 natural sciences, Threshold voltage, Reduction (complexity), 0103 physical sciences, Electronic engineering, Wafer, 0210 nano-technology, Metal gate, Critical dimension, Scaling, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f8d974e0e003d1ca6587c290e85e6a2f
https://doi.org/10.1109/iedm19573.2019.8993480 -
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المؤلفون: R. Divakaruni, C. Alix, Trace Hurd, M. Sankar, Aelan Mosden, Mary Breton, Thamarai S. Devarajan, Huimei Zhou, Chanemougame Daniel, Shanti Pancharatnam, Peter Biolsi, Subhadeep Kal, Andrew M. Greene, V. Basker, Kandabara Tapily, Jeffrey Smith, Balasubramanian S. Pranatharthi Haran, Jingyun Zhang, N. Haller, Michael P. Belyansky, Curtis Durfee, Robin Chao, Huiming Bu, Koji Watanabe, Xin Miao, Lan Yu, Frougier Julien, Nicolas Loubet
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Transconductance, Transistor, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Subthreshold slope, Threshold voltage, law.invention, law, 0103 physical sciences, Optoelectronics, Wafer, Dry etching, 0210 nano-technology, business, Selectivity, Nanosheet
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8a6e01721ad7408977b9a1566f4c50ef
https://doi.org/10.1109/iedm19573.2019.8993615 -
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المؤلفون: E. Engbrecht, Edward P. Maciejewski, Christopher D. Sheraw, R. Divakaruni, Zhengwen Li, Allen H. Gabor, L. Economikos, Fernando Guarin, N. Zhan, H-K Lee, MaryJane Brodsky, Kenneth J. Stein, Siyuranga O. Koswatta, Y. Yang, Byeong Y. Kim, J. Hong, A. Bryant, Herbert L. Ho, Ruqiang Bao, Nicolas Breil, Babar A. Khan, E. Woodard, W-H. Lee, C-H. Lin, A. Levesque, Kevin McStay, V. Basker, Viraj Y. Sardesai, C. Tran, A. Ogino, Reinaldo A. Vega, C. DeWan, Shreesh Narasimha, J-J. An, Amit Kumar, A. Aiyar, Ravikumar Ramachandran, W. Wang, X. Wang, W. Nicoll, D. Hoyos, A. Friedman, Barry Linder, Yongan Xu, E. Alptekin, Cathryn Christiansen, S. Polvino, Han Wang, Scott R. Stiffler, G. Northrop, S. Saudari, J. Rice, Saraf Iqbal Rashid, Sunfei Fang, Michael V. Aquilino, Z. Ren, B. Kannan, Geng Wang, Noah Zamdmer, T. Kwon, Paul D. Agnello, Hasan M. Nayfeh, S. Jain, Robert R. Robison, M. Hasanuzzaman, J. Cai, L. Lanzerotti, D. Wehelle-Gamage, Basanth Jagannathan, J. Johnson, E. Kaste, Kai Zhao, Huiling Shang, Carl J. Radens, Shariq Siddiqui, Y. Ke, D. Ferrer, Ximeng Guan, D. Conklin, K. Boyd, K. Henson, Siddarth A. Krishnan, Bernard A. Engel, H. Dong, S. Mahajan, Unoh Kwon, Dominic J. Schepis, William Y. Chang, Liyang Song, Brian J. Greene, Chengwen Pei, S.-J. Jeng, Clevenger Leigh Anne H, Vijay Narayanan, C. Zhu, Wai-kin Li, Henry K. Utomo, Wei Liu, Dureseti Chidambarrao
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Engineering, Subthreshold conduction, business.industry, Processor design, Copper interconnect, Soi finfet, Hardware_PERFORMANCEANDRELIABILITY, Thread (computing), Planar, CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6233530b0b3fd6ddc14276a018716523
https://doi.org/10.1109/iedm.2014.7046977 -
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المؤلفون: H. Kawasaki, Junli Wang, V. Basker, J. Faltermeier, Pranita Kulkarni, James A. O’Neill, Tenko Yamashita, T. Levin, D. McHerron, H. Adhikari, S. Kanakasabapathy, R. C. Johnson, Huiming Bu, R. J. Miller, Hiroshi Sunamura, Mariko Takayanagi, Yu Zhu, Effendi Leobandung, Atsuro Inada, S. Holmes, Jason E. Cummings, Masami Hane, James J. Demarest, Amit Kumar, Atsushi Yagishita, T. Yamamoto, Bruce B. Doris, Hemanth Jagannathan, Erin Mclellan, Chung Hsun Lin, Matthew E. Colburn, Jeremy A. Wahl, Stefan Schmitz, J. Kuss, Kingsuk Maitra, Lisa F. Edge, Vamsi Paruchuri, Theodorus E. Standaert, R. H. Kim, C.-C. Yeh
المصدر: 2010 Symposium on VLSI Technology.
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, law.invention, law, Logic gate, MOSFET, Optoelectronics, Static random-access memory, Photolithography, business, Metal gate, Lithography, AND gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5afe0dec503f0b360dca5be1318fb10e
https://doi.org/10.1109/vlsit.2010.5556135 -
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المؤلفون: Hemanth Jagannathan, Kangguo Cheng, Philip J. Oldiges, Chun-Chen Yeh, Pranita Kulkarni, Miaomiao Wang, Huiming Bu, Bruce B. Doris, Chung-Hsun Lin, Kingsuk Maitra, Ali Khakifirooz, James H. Stathis, Vamsi Paruchuri, V. Basker
المصدر: 2010 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, Silicon on insulator, law.invention, law, Logic gate, MOSFET, Optoelectronics, Degradation (geology), business, Metal gate, Hot carrier degradation, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::92b1ab1b497e079354376cc7f8d4c8a6
https://doi.org/10.1109/irps.2010.5488664 -
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المؤلفون: Sanjay Mehta, R. H. Kim, V. Basker, Sean D. Burns, Kangguo Cheng, Yu Zhu, A. Ebert, Scott Halle, Chen Jia, Karen Petrillo, Soon-Cheon Seo, D. Horak, Vamsi Paruchuri, R. Johnson, T. Levin, Hemanth Jagannathan, J. Faltermeier, Jason E. Cummings, T. Sparks, M. Raymond, Wilfried Haensch, Lahir Shaik Adam, Su Chen Fan, Amit Kumar, N. Berliner, Bala S. Haran, Terry A. Spooner, S. Kanakasabapathy, Stefan Schmitz, J. Kuss, Josephine B. Chang, Thomas S. Kanarsky, Lisa F. Edge, Chiew-seng Koay, Charles W. Koburger, John C. Arnold, S. Holmes, Bruce B. Doris, Erin Mclellan, D. LaTulipe, Martin Burkhardt, D. McHerron, S. Paparao, Donald F. Canaperi, M. Smalley, James J. Demarest, Matt Colburn
المصدر: 2008 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Transistor, Copper interconnect, Electrical engineering, law.invention, chemistry.chemical_compound, chemistry, law, Logic gate, Silicide, Optoelectronics, Node (circuits), business, Metal gate, Immersion lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3f2618a1a98015406797d8aa44d360c1
https://doi.org/10.1109/iedm.2008.4796769 -
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المؤلفون: Vijay Narayanan, Barry P. Linder, Richard Haight, V. Basker, Ghavam G. Shahidi, J. Rubino, Daeyoung Lim, Roy A. Carruthers, Vamsi Paruchuri, Thomas M. Shaw, Hariklia Deligianni, Eduard A. Cartier, Fenton R. McFeely, Matthew Copel, Jeffrey W. Sleight, Michelle L. Steen, Paul C. Jamison, Supratik Guha, Rajarao Jammy
المصدر: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Electrical engineering, Analytical chemistry, Partial pressure, Capacitance, Metal, Dipole, visual_art, Electrode, visual_art.visual_art_medium, business, Forming gas, MISFET
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5821f953a1c143c010c0d26c5966aa6e
https://doi.org/10.1109/.2005.1469279