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1
المؤلفون: E. A. Grushevski, N. G. Savinski, V. I. Bachurin, L. A. Mazaletsky
المصدر: Bulletin of the Russian Academy of Sciences: Physics. 86:552-555
مصطلحات موضوعية: General Physics and Astronomy
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2
المؤلفون: D. N. Savelyev, E. A. Grushevski, M. A. Smirnova, L. A. Mazaletsky, N. G. Savinski, V. I. Bachurin, A. B. Churilov
المصدر: Bulletin of the Russian Academy of Sciences: Physics. 86:556-561
مصطلحات موضوعية: General Physics and Astronomy
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3
المؤلفون: M. A. Smirnova, V. I. Bachurin, L. A. Mazaletsky, D. E. Pukhov, A. B. Churilov, A. S. Rudy
المصدر: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15:S150-S156
مصطلحات موضوعية: Surfaces, Coatings and Films
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4
المؤلفون: A. E. Ieshkin, A. A. Tatarintsev, D. S. Kireev, V. I. Bachurin, A. S. Rudyi
المصدر: Technical Physics Letters. 47:381-384
مصطلحات موضوعية: Physics and Astronomy (miscellaneous)
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5
المؤلفون: A. B. Churilov, A. S. Rudy, D. E. Pukhov, M. A. Smirnova, S. G. Simakin, I. V. Zhuravlev, V. I. Bachurin
المصدر: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 14:784-790
مصطلحات موضوعية: 010302 applied physics, Auger electron spectroscopy, Materials science, Silicon, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Focused ion beam, Surfaces, Coatings and Films, Secondary ion mass spectrometry, chemistry, Sputtering, 0103 physical sciences, Surface layer, Gallium, Thin film, 0210 nano-technology
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6
المؤلفون: N. G. Savinsky, V. I. Bachurin, N. S. Melesov, A. B. Churilov, S. V. Vasiliev, E. O. Parshin
المصدر: Bulletin of the Russian Academy of Sciences: Physics. 84:732-735
مصطلحات موضوعية: 010302 applied physics, Materials science, 010308 nuclear & particles physics, Graphene, X-ray, General Physics and Astronomy, Electrochemistry, Rutherford backscattering spectrometry, 01 natural sciences, Exfoliation joint, law.invention, Chemical engineering, law, 0103 physical sciences, Graphite, Crystallite, Chemical composition
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7
المؤلفون: A. S. Rudy, N. S. Melesov, A. B. Churilov, E. O. Parshin, V. I. Bachurin
المصدر: Technical Physics Letters. 45:609-612
مصطلحات موضوعية: 010302 applied physics, Materials science, Physics and Astronomy (miscellaneous), business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Rutherford backscattering spectrometry, 01 natural sciences, Atomic mass, 0103 physical sciences, Optoelectronics, Thin film, 0210 nano-technology, business
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8
المؤلفون: E. O. Parshin, A. S. Rudy, A. A. Mironenko, V. I. Bachurin, A. B. Churilov, S. G. Simakin, N. S. Melesov
المصدر: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13:300-305
مصطلحات موضوعية: 010302 applied physics, Materials science, Analytical chemistry, Film density, 02 engineering and technology, 021001 nanoscience & nanotechnology, Mass spectrometry, Rutherford backscattering spectrometry, 01 natural sciences, Spectral line, Surfaces, Coatings and Films, Secondary ion mass spectrometry, Condensed Matter::Materials Science, Film structure, 0103 physical sciences, Thin film, 0210 nano-technology
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9
المؤلفون: M. O. Izyumov, I. I. Amirov, N. O. Shuvaev, V. I. Bachurin
المصدر: Bulletin of the Russian Academy of Sciences: Physics. 82:127-130
مصطلحات موضوعية: inorganic chemicals, 010302 applied physics, Materials science, Argon, Silicon, 010308 nuclear & particles physics, Silicon dioxide, technology, industry, and agriculture, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Plasma, equipment and supplies, complex mixtures, 01 natural sciences, Nitrogen, Ion, stomatognathic diseases, chemistry.chemical_compound, Low energy, chemistry, Sputtering, 0103 physical sciences
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10
المؤلفون: V. I. Bachurin, A.S. Rudy, A.N. Kulikov
المصدر: Vacuum. 193:110504
مصطلحات موضوعية: Surface (mathematics), Materials science, Ion beam, Gaussian, Mechanics, Condensed Matter Physics, Surfaces, Coatings and Films, symbols.namesake, Sputtering, Etching (microfabrication), Trench, symbols, Erosion, Boundary value problem, Instrumentation