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1
المؤلفون: T. Pieczonka, V. Kovtun, V. Pasovets
المصدر: Archives of Metallurgy and Materials, Vol 60, Iss 1, Pp 51-55 (2015)
مصطلحات موضوعية: lcsh:TN1-997, Materials science, Materials processing, triboengineering characteristics, Carbon Nanoparticles, carbon nanoparticles, Metals and Alloys, Industrial chemistry, chemistry.chemical_element, Copper, powder metallurgy, mechanical activation, chemistry, Powder metallurgy, lcsh:TA401-492, composite powder materials, lcsh:Materials of engineering and construction. Mechanics of materials, Composite material, physico-mechanical properties, lcsh:Mining engineering. Metallurgy, electrocontact sintering
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2
المؤلفون: S. V. Pasovets, Joseph Macek, S. Yu. Ovchinnikov
المصدر: Physical Review Letters. 74:4631-4634
مصطلحات موضوعية: Physics, Spin states, Hydrogen, media_common.quotation_subject, Anharmonicity, General Physics and Astronomy, chemistry.chemical_element, Context (language use), Asymmetry, chemistry, Ionization, Physics::Atomic Physics, Atomic physics, Electron ionization, media_common, Spin-½
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3
المؤلفون: E.V. Shpak, S. V. Pasovets, L.P. Ovsyannikova
المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 298:344-348
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, business.industry, Astrophysics::Cosmology and Extragalactic Astrophysics, Charged particle, Optics, Chromatic aberration, Physics::Accelerator Physics, Magnetic lens, Coaxial, Charged particle beam, Focus (optics), business, Axial symmetry, Instrumentation
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4Ion-optical system with energy filtering for sputtering neutral and secondary ion mass spectrometers
المؤلفون: E.V. Shpak, L. P. Ovsyannikova, S. V. Pasovets, T. Ya. Fishkova
المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 298:179-180
مصطلحات موضوعية: Physics, Secondary ion mass spectrometry, Nuclear and High Energy Physics, Static secondary-ion mass spectrometry, Physics::Plasma Physics, Sputtering, Selected ion monitoring, Time-of-flight mass spectrometry, Atomic physics, Mass spectrometry, Instrumentation, Electrostatic lens, Ion
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6دورية أكاديمية
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7دورية أكاديمية
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