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1مؤتمر
المؤلفون: Lambertson, R., Malazgirt, A., Lo, C., Vahidimowlavi, A., Holland, P., Fliesler, M., Gee, H.
المصدر: International Electron Devices Meeting 1991 [Technical Digest] Electron Devices Meeting, 1991. IEDM '91. Technical Digest., International. :299-302 1991
Relation: 1991 International Electron Devices Meeting
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2مؤتمر
المؤلفون: Nobunaga, Dean, Abedifard, Ebrahim, Roohparvar, Frankie, Lee, June, Yu, Erwin, Vahidimowlavi, Allahyar, Abraham, Michael, Talreja, Sanjay, Sundaram, Rajesh, Rozman, Rod, Vu, Luyen, Chen, Chih Liang, Chandrasekhar, Uday, Bains, Rupinder, Viajedor, Vimon, Mak, William, Choi, Munseork, Udeshi, Darshak, Luo, Michelle, Qureshi, Shahid, Tsai, Jeffrey, Jaffin, Frederick, Liu, Yujiang, Mancinelli, Marco
المصدر: 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2008. ISSCC 2008. Digest of Technical Papers. IEEE International. :426-625 Feb, 2008
Relation: 2008 International Solid-State Circuits Conference - (ISSCC)
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المؤلفون: Uday Chandrasekhar, June Lee, Rupinder Bains, M. Abraham, M. Luo, Jeff Tsai, Rajesh Sundaram, Erwin E. Yu, Chih Liang Chen, Allahyar Vahidimowlavi, Dean Nobunaga, Yujiang Liu, Sanjay S. Talreja, M. Mancinelli, Rodney R. Rozman, Darshak Udeshi, Ebrahim Abedifard, S. Qureshi, Luyen Vu, Frankie F. Roohparvar, W. Mak, V. Viajedor, M. Choi, Frederick T. Jaffin
المصدر: ISSCC
مصطلحات موضوعية: Flash (photography), Hardware_MEMORYSTRUCTURES, Computer science, Nand flash memory, business.industry, Interface (computing), NAND gate, business, Double data rate, Throughput (business), Computer hardware, Flash file system, Flash memory
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::46eca1c08bab118fb3ba488e915d090c
https://doi.org/10.1109/isscc.2008.4523239 -
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المؤلفون: A. Vahidimowlavi, A. Malazgirt, R. Lambertson, M. Fliesler, H. Gee, C. Lo, P. Holland
المصدر: International Electron Devices Meeting 1991 [Technical Digest].
مصطلحات موضوعية: Capacitive coupling, Very-large-scale integration, Materials science, business.industry, Electrical engineering, Volt, Cell size, law.invention, law, Cell structure, EPROM, business, Quantum tunnelling, EEPROM
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a1a3a95753ac4a29941ff6693446f326
https://doi.org/10.1109/iedm.1991.235444
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