-
1مؤتمر
المؤلفون: Civale, Yann, Redolfi, Augusto, Jaenen, Patrick, Kostermans, Maarten, Van Besien, Els, Mertens, Sofie, Witters, Thomas, Jourdan, Nicolas, Armini, Silvia, El-Mekki, Zaid, Vandersmissen, Kevin, Philipsen, Harold, Verdonck, Patrick, Heylen, Nancy, Nolmans, Philip, Yunlong Li, Croes, Kristof, Beyer, Gerald, Swinnen, Bart, Beyne, Eric
المصدر: 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International. :1-5 Nov, 2012
Relation: 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT)
-
2مؤتمر
المؤلفون: Van Besien, Els, Wang, Cong, Verdonck, Patrick, Singh, Arjun, Barbarin, Yohan, de Marneffe, Jean-Francois, Vanstreels, Kris, Tielens, Hilde, Schaekers, Marc, Baklanov, Mikhail R., Van Elshocht, Sven
المصدر: 2013 IEEE International Interconnect Technology Conference - IITC Interconnect Technology Conference (IITC), 2013 IEEE International. :1-3 Jun, 2013
Relation: 2013 IEEE International Interconnect Technology Conference - IITC
-
3مؤتمر
المؤلفون: Siew, Yong Kong, Versluijs, Janko, Kunnen, Eddy, Ciofi, Ivan, Alaerts, Wilfried, Dekkers, Harold, Volders, Henny, Suhard, Samuel, Cockburn, Andrew, Sleeckx, Erik, Van Besien, Els, Struyf, Herbert, Maenhoudt, Mireille, Noori, Atif, Padhi, Deenesh, Shah, Kavita, Gravey, Virginie, Beyer, Gerald
المصدر: 2010 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2010 International. :1-3 Jun, 2010
Relation: 2010 IEEE International Interconnect Technology Conference - IITC
-
4دورية أكاديمية
المؤلفون: Van Besien, Els, Singh, Arjun, Barbarin, Yohan, Verdonck, Patrick, Dekkers, Harold F.W., Vanstreels, Kris, de Marneffe, Jean-François, Baklanov, Mikhail R., Van Elshocht, Sven
المصدر: In Microelectronic Engineering 25 May 2014 120:221-224
-
5دورية أكاديمية
المؤلفون: Swerts, Johan, Siew, Yong-Kong, Van Besien, Els, Barbarin, Yohan, Opsomer, Karl, Bömmels, Jürgen, Tőkei, Zsolt, Van Elshocht, Sven
المصدر: In Microelectronic Engineering 25 May 2014 120:235-239
-
6دورية أكاديمية
المؤلفون: Van Besien, Els, Pantouvaki, Marianna, Zhao, Larry, De Roest, David, Baklanov, Mikhail R., Tőkei, Zsolt, Beyer, Gerald
المصدر: In Microelectronic Engineering April 2012 92:59-61
-
7دورية أكاديمية
المؤلفون: Zhao, Larry, Volders, Henny, Baklanov, Mikhail, Tőkei, Zsolt, Pantouvaki, Marianna, Wilson, Christopher J., Van Besien, Els, Beyer, Gerald P., Claeys, Cor
المصدر: In Microelectronic Engineering 2011 88(9):3030-3034
-
8دورية أكاديمية
المؤلفون: Pantouvaki, Marianna, Sebaai, Farid, Kellens, Kristof, Goossens, Danny, Vereecke, Bart, Versluijs, Janko, Van Besien, Els, Caluwaerts, Rudy, Marrant, Koen, Bender, Hugo, Moussa, Alain, Struyf, Herbert, Beyer, Gerald P.
المصدر: In Microelectronic Engineering 2011 88(7):1618-1622
-
9دورية أكاديميةEvaluations of intrinsic time dependent dielectric breakdown of dielectric copper diffusion barriers
المؤلفون: Zhao, Larry, Lofrano, Melina, Croes, Kristof, Van Besien, Els, Tőkei, Zsolt, Wilson, Christopher J., Degraeve, Robin, Kauerauf, Thomas, Beyer, Gerald P., Claeys, Cor
المصدر: In Thin Solid Films 2011 520(1):662-666
-
10دورية أكاديمية
المؤلفون: Verdonck, Patrick, Šamara, Vladimir, Goodyear, Alec, Ferchichi, Abdelkarim, Van Besien, Els, Baklanov, Mikhail R., Braithwaite, Nicholas
المصدر: In Thin Solid Films 2011 520(1):464-468