المؤلفون: Essex, B.^{Aff1, Aff2}, Koop, S. H. A.^{Aff1, Aff2}, Van Leeuwen, C. J.^{Aff1, Aff2}

المصدر: Environmental Management. 65(1):1-18

المؤلفون: Koop, S. H. A., Koetsier, L., Doornhof, A., Reinstra, O., Van Leeuwen, C. J., Brouwer, S., Dieperink, C., Driessen, P. P. J.

المصدر: Water Resources Management: An International Journal - Published for the European Water Resources Association (EWRA). September 2017 31(11):3427-3443

المؤلفون: Koop, S. H. A., van Leeuwen, C. J.

المصدر: Environment, Development and Sustainability: A Multidisciplinary Approach to the Theory and Practice of Sustainable Development. April 2017 19(2):385-418

المؤلفون: Jaworska, Joanna S., Comber, M., Auer, C., Van Leeuwen, C. J.

المصدر: Environmental Health Perspectives, 2003 Aug 01. 111(10), 1358-1360.

URL الوصول: https://www.jstor.org/stable/3435408

المؤلفون: van der Sluiszen, N. N. J. J. M., Vermeeren, A., Jongen, S., Theunissen, E. L., van Oers, A. C. M., Van Leeuwen, C. J., Maret, A., Desforges, C., Delarue, A., Ramaekers, J. G.

المصدر: Psychopharmacology. September 2016 233(18):3461-3469

المؤلفون: Van Leeuwen, C. J., Koop, S. H. A., Sjerps, R. M. A.

المصدر: Environment, Development and Sustainability: A Multidisciplinary Approach to the Theory and Practice of Sustainable Development. August 2016 18(4):1113-1128

المؤلفون: Van Leeuwen, C. J.

المساهمون: van Leeuwen, C. J., editor^Aff1, Hermens, J. L. M., editor^Aff2

المصدر: Risk Assessment of Chemicals : An Introduction. :175-237

المؤلفون: van Leeuwen, C. J.

المساهمون: van Leeuwen, C. J., editor^Aff1, Hermens, J. L. M., editor^Aff2

المصدر: Risk Assessment of Chemicals : An Introduction. :1-17

المؤلفون: van Leeuwen, C. J.

المصدر: Water Resources Management: An International Journal - Published for the European Water Resources Association (EWRA). December 2013 27(15):5191-5206

المؤلفون: Lowry, R. K., Van Leeuwen, C. J., Kennimer, B. L., Miller, L. A.

المصدر: 16th International Reliability Physics Symposium Reliability Physics Symposium, 1978. 16th Annual. :207-212 Apr, 1978

Relation: 16th International Reliability Physics Symposium