المؤلفون: Bazizi, E. M, Zaka, A., Herrmann, T., Benistant, F., Tin, J. H. M., Goh, J. P., Jiang, L., Joshi, M., van Meer, H., Korablev, K.

المصدر: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on. :25-28 Sep, 2014

Relation: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المؤلفون: Bazizi, E. M, Zaka, A., Herrmann, T., Benistant, F., Tin, J. H. M., Goh, J. P., Jiang, L., Joshi, M., van Meer, H., Korablev, K.

المصدر: 2014 44th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2014 44th European. :341-344 Sep, 2014

Relation: ESSDERC 2014 - 44th European Solid State Device Research Conference

المؤلفون: Everaert, J-L., Schaekers, M., Yu, H., Wang, L.-L., Hikavyy, A., Date, L., del Agua Borniquel, J., Hollar, K., Khaja, F. A., Aderhold, W., Mayur, A. J., Lee, J. Y., van Meer, H., Jiang, Y.-L., De Meyer, K., Mocuta, D., Horiguchi, N.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T214-T215 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Breil, N., Carr, A., Kuratomi, T., Lavoie, C., Chen, I.-C., Stolfi, M., Chiu, K. D., Wang, W., Van Meer, H., Sharma, S., Hung, R., Gelatos, A., Jordan-Sweet, J., Levrau, E., Loubet, N., Chao, R., Ye, J., Ozcan, A., Surisetty, C., Chudzik, M.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T216-T217 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Wang, Lin-Lin, Yu, Hao, Schaekers, M., Everaert, J.-L., Franquet, A., Douhard, B., Date, L., del Agua Borniquel, J., Hollar, K., Khaja, F. A., Aderhold, W., Mayur, A. J., Lee, J. Y., van Meer, H., Mocuta, D., Horiguchi, N., Collaert, N., De Meyer, K., Jiang, Yu-Long

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :22.4.1-22.4.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Lukyanchikova, N., Petrichuk, M., Garbar, N., Simoen, E., Mercha, A., van Meer, H., De Meyer, K., Claeys, C.

المصدر: 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :75-78 2002

Relation: 32nd European Solid-State Device Research Conference

المؤلفون: Pavanello, M.A., Martino, J.A., Mercha, A., Rafi, J.M., Simoen, E., Claeys, C., van Meer, H., De Meyer, K.

المصدر: Proceedings of the 5th European Workshop on Low Temperature Electronics Low Temperature Electronics, 2002. Proceedings of the 5th European Workshop on. :31-34 2002

Relation: Proceedings of the 5th European Workshop on Low Temperature Electronics

المؤلفون: De Meyer, K., Kubicek, S., van Meer, H.

المصدر: Extended Abstracts of the Second International Workshop on Junction Technology. IWJT. (IEEE Cat.No.01EX541C) Junction technology Junction Technology, 2001. IWJT. Extended Abstracts of the Second International Workshop on. :87-90 2001

Relation: Extended Abstracts of the Second International Workshop on Junction Technology

المؤلفون: van Meer, H., De Meyer, K.

المصدر: 30th European Solid-State Device Research Conference Solid-State Device Research Conference, 2000. Proceeding of the 30th European. :348-351 2000

Relation: 30th European Solid-State Device Research Conference

المؤلفون: Schreurs, D., Vandenberghe, S., Nauwelaers, B., van Meer, H., Lyu, L., Kubicek, S., De Meyer, K.

المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:376-379 1999

Relation: 29th European Solid-State Device Research Conference