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1مؤتمر
المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :379-382 Jul, 2016
Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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2تقرير
المؤلفون: Concas, A., Dessì, R., Fenu, C., Rodriguez, G., Vanzi, M.
المصدر: 2021 21st International Conference on Computational Science and Its Applications (ICCSA)
مصطلحات موضوعية: Mathematics - Numerical Analysis
URL الوصول: http://arxiv.org/abs/1809.06933
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3مؤتمر
المصدر: Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the. :207-210 Jun, 2014
Relation: 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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4مؤتمر
المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :599-602 Jul, 2013
Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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5مؤتمر
المؤلفون: Vanzi, M., Mura, G., Marcello, G.
المصدر: 2014 Third Mediterranean Photonics Conference Photonics Conference, 2014 Third Mediterranean. :1-3 May, 2014
Relation: 2014 Third Mediterranean Photonics Conference
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6دورية أكاديمية
المصدر: In Microelectronics Reliability November 2020 114
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7مؤتمر
المؤلفون: Rusani, A., Kuchenbecker, J., Norgarino, M., Plana, R., Graffeuil, J., Vanzi, M.
المصدر: 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401) High performance electron devices for microwave and optoelectronic applications High Performance Electron Devices for Microwave and Optoelectronic Applications, 1999. EDMO. 1999 Symposium on. :260-265 1999
Relation: 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO
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8دورية أكاديمية
المؤلفون: Spezzigu, P., Caddeo, C., Quadri, G., Gilard, O., Bechou, L., Ousten, Y., Vanzi, M.
المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(4):2465-2472 Aug, 2009
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9مؤتمرREDR-based kinetics for line defects leading to sudden failures in 980 nm SL SQW InGaAs laser diodes
المؤلفون: Bonfiglio, A., Casu, M.B., Vanzi, M., Magistrali, F., Maini, M., Salmini, G.
المصدر: 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173) Reliability physics Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International. :113-118 1998
Relation: 1998 IEEE International Reliability Physics Symposium Proceedings 36th Annual
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10دورية أكاديمية
المؤلفون: Trevisanello, L., Meneghini, M., Mura, G., Vanzi, M., Pavesi, M., Meneghesso, G., Zanoni, E.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 8(2):304-311 Jun, 2008
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