المؤلفون: Vatajelu, Elena I., Rodriguez-Montanes, R., Di Carlo, S., Indaco, M., Renovell, M., Prinetto, P., Figueras, J.

المصدر: 2015 20th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2015 20th IEEE European. :1-6 May, 2015

Relation: 2015 20th IEEE European Test Symposium (ETS)

المؤلفون: Vatajelu, Elena I., Rodriguez-Montanes, Rosa, Indaco, Marco, Prinetto, Paolo, Figueras, Joan

المصدر: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on. :1-6 Apr, 2015

Relation: 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)

المؤلفون: Vatajelu, Elena I., Rodriguez-Montanes, Rosa, Indaco, Marco, Renovell, Michel, Prinetto, Paolo, Figueras, Joan

المصدر: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015. :447-452 Mar, 2015

Relation: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Arcaro, S., Di Carlo, S., Indaco, M., Pala, D., Prinetto, P., Vatajelu, Elena I.

المصدر: 2014 9th International Design and Test Symposium (IDT) Design & Test Symposium (IDT), 2014 9th International. :67-72 Dec, 2014

Relation: 2014 9th International Design & Test Symposium (IDT)

المؤلفون: Di Carlo, S., Indaco, M., Prinetto, P., Vatajelu, Elena I., Rodriguez-Montanes, R., Figueras, J.

المصدر: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on. :75-80 Oct, 2014

Relation: 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Indaco, Marco, Prinetto, Paolo, Vatajelu, Elena I.

المصدر: 2014 19th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2014 19th IEEE European. :1-10 May, 2014

Relation: 2014 19th IEEE European Test Symposium (ETS)

المؤلفون: Vatajelu, Elena I., Dilillo, L., Bosio, A., Girard, P., Todri, A., Virazel, A., Badereddine, N.

المصدر: 2013 22nd Asian Test Symposium Test Symposium (ATS), 2013 22nd Asian. :109-114 Nov, 2013

Relation: 2013 22nd Asian Test Symposium (ATS)

المؤلفون: Vatajelu, Elena I., Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Salgne, F.

المصدر: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on. :143-148 Oct, 2013

Relation: 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

المؤلفون: Tsiligiannis, G., Vatajelu, Elena I., Dilillo, L., Bosio, A., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Wrobel, F., Saigne, F.

المصدر: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. :145-150 Jul, 2013

Relation: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS)

المؤلفون: Vatajelu, Elena I., Bosio, A., Dilillo, L., Girard, P., Todri, A., Virazel, A., Badereddine, N.

المصدر: 2013 18th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2013 18th IEEE European. :1-6 May, 2013

Relation: 2013 18th IEEE European Test Symposium (ETS)