نتائج البحث - "Vi, Tran Duc"

تحديد النتيجة رقم 1
1

كتاب إلكتروني

Optimization of Process Parameters in the Abrasive Waterjet Machining Using Bees Algorithm

المؤلفون: Vi, Tran Duc^Aff13, Duy, Nguyen Bao^Aff13

المساهمون: Kacprzyk, Janusz, Series Editor^Aff1, Gomide, Fernando, Advisory Editor^Aff2, Kaynak, Okyay, Advisory Editor^Aff3, Liu, Derong, Advisory Editor^Aff4, Pedrycz, Witold, Advisory Editor^Aff5, Polycarpou, Marios M., Advisory Editor^Aff6, Rudas, Imre J., Advisory Editor^Aff7, Wang, Jun, Advisory Editor^Aff8, Nanda, Satyasai Jagannath, editor^Aff9, Yadav, Rajendra Prasad, editor^Aff10, Gandomi, Amir H., editor^Aff11, Saraswat, Mukesh, editor^Aff12

المصدر: Data Science and Applications : Proceedings of ICDSA 2023, Volume 2. 819:37-50

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تحديد النتيجة رقم 2
2

كتاب إلكتروني

A Learning-Based Approach for Wafer Defect Detection in Production Quality Control

المؤلفون: Yen, Hoang Hai^Aff13, Nguyen, Nguyen Khai^Aff13, Tram, Pham Bao^Aff13, Vi, Tran Duc^Aff13

المساهمون: Kacprzyk, Janusz, Series Editor^Aff1, Gomide, Fernando, Advisory Editor^Aff2, Kaynak, Okyay, Advisory Editor^Aff3, Liu, Derong, Advisory Editor^Aff4, Pedrycz, Witold, Advisory Editor^Aff5, Polycarpou, Marios M., Advisory Editor^Aff6, Rudas, Imre J., Advisory Editor^Aff7, Wang, Jun, Advisory Editor^Aff8, Nanda, Satyasai Jagannath, editor^Aff9, Yadav, Rajendra Prasad, editor^Aff10, Gandomi, Amir H., editor^Aff11, Saraswat, Mukesh, editor^Aff12

المصدر: Data Science and Applications : Proceedings of ICDSA 2023, Volume 1. 818:361-374

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تحديد النتيجة رقم 3
3

كتاب إلكتروني

Predictive Models for Equipment Fault Detection: Application in Semiconductor Industry

المؤلفون: Duy, Tran Quang^Aff13, Vi, Tran Duc^Aff13

المساهمون: Kacprzyk, Janusz, Series Editor^Aff1, Gomide, Fernando, Advisory Editor^Aff2, Kaynak, Okyay, Advisory Editor^Aff3, Liu, Derong, Advisory Editor^Aff4, Pedrycz, Witold, Advisory Editor^Aff5, Polycarpou, Marios M., Advisory Editor^Aff6, Rudas, Imre J., Advisory Editor^Aff7, Wang, Jun, Advisory Editor^Aff8, Das, Swagatam, editor^Aff9, Saha, Snehanshu, editor^Aff10, Coello Coello, Carlos A., editor^Aff11, Bansal, Jagdish Chand, editor^Aff12

المصدر: Advances in Data-driven Computing and Intelligent Systems : Selected Papers from ADCIS 2022, Volume 2. 653:225-237

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تحديد النتيجة رقم 4
4

كتاب إلكتروني

Application of Deep Learning for Wafer Defect Classification in Semiconductor Manufacturing

المؤلفون: Hanh, Nguyen Thi Minh^Aff6, Vi, Tran Duc^Aff6

المساهمون: Bansal, Jagdish Chand, Series Editor^{Aff1, Aff5}, Deep, Kusum, Series Editor^Aff2, Nagar, Atulya K., Series Editor^Aff3, Uddin, Mohammad Shorif, editor^Aff4

المصدر: Proceedings of International Joint Conference on Advances in Computational Intelligence : IJCACI 2022. :327-339

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تحديد النتيجة رقم 5
5

كتاب إلكتروني

Hybrid Genetic-Bees Algorithm in Multi-layer Perceptron Optimization

المؤلفون: Anh, Truong Tran Mai^Aff13, Vi, Tran Duc^Aff13

المساهمون: Kacprzyk, Janusz, Series Editor^Aff1, Gomide, Fernando, Advisory Editor^Aff2, Kaynak, Okyay, Advisory Editor^Aff3, Liu, Derong, Advisory Editor^Aff4, Pedrycz, Witold, Advisory Editor^Aff5, Polycarpou, Marios M., Advisory Editor^Aff6, Rudas, Imre J., Advisory Editor^Aff7, Wang, Jun, Advisory Editor^Aff8, Saraswat, Mukesh, editor^Aff9, Chowdhury, Chandreyee, editor^Aff10, Kumar Mandal, Chintan, editor^Aff11, Gandomi, Amir H., editor^Aff12

المصدر: Proceedings of International Conference on Data Science and Applications : ICDSA 2022, Volume 2. 552:145-157

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