المؤلفون: Tavel, B., Duriez, B., Gwoziecki, R., Basso, M.T., Julien, C., Ortolland, C., Laplanche, Y., Fox, R., Saboure, E., Detcheverry, C., Boeuf, F., Morin, P., Barge, D., Bidaud, M., Bienacel, J., Garnier, P., Cooper, K., Chapon, J.D., Trouille, Y., Belledent, J., Broekaart, M., Gouraud, P., Denais, M., Huard, V., Rochereau, K., Difrenza, R., Planes, N., Marin, M., Boret, S., Gloria, D., Vanbergue, S., Abramowitz, P., Vishnubhotla, L., Reber, D., Stolk, P., Woo, M., Arnaud, F.

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :423-426 2005

Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

المؤلفون: Denais, M., Bravaix, A., Huard, V., Parthasarathy, C., Bidaud, M., Ribes, G., Barge, D., Vishnubhotla, L., Tavel, B., Rey-Tauriac, Y., Perrier, F., Revil, N., Arnaud, F., Stolk, P.

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :121-124 2004

Relation: 2004 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: Balasinski, A., Vishnubhotla, L., Ma, T.P., Tseng, H.-H., Tobin, P.J.

المصدر: 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on. :95-99 1993

Relation: 1993 International Symposium on VLSI Technology, Systems, and Applications

المؤلفون: Yeap, G.C.-F., Chen, J., Grudowski, P., Jeon, Y., Shiho, Y., Qi, W., Jallepalli, S., Ramani, N., Hellig, K., Vishnubhotla, L., Luo, T., Tseng, H., Du, Y., Lim, S., Abramowitz, P., Reddy, C., Parihar, S., Singh, R., Wright, M., Patterson, K., Benavides, N., Bonser, D., Gompel, T.V., Conner, J., Lee, J.J., Rendon, M., Hall, D., Nghiem, A., Stout, R., Weidemann, K., Duvallet, A., Alvis, J., Dyer, D., Burnett, D., Ingersoll, P., Wimmer, K., Veeraraghavan, S., Foisy, M., Hall, M., Pellerin, J., Wristers, D., Woo, M., Lage, C.

المصدر: 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) VLSI technology VLSI Technology, 2002. Digest of Technical Papers. 2002 Symposium on. :16-17 2002

Relation: 2002 Symposium on VLSI Technology Digest of Technical Papers

المؤلفون: Vishnubhotla, L., Ma, T.-P., Hsing-Huang Tseng, Tobin, P.J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 14(4):196-198 Apr, 1993

المؤلفون: Parihar, S., Angyal, M., Boeck, B., Reber, D., Singhal, A., Van Gompel, T., Li, R., Wilson, B., Wright, M., Chen, J., Grudowski, P., Jeon, Y., Qi, W., Bai, X., Parker, L., Strozewski, K., Smith, D., Roling, S., Sparks, T., Stephens, T., Huang, F., Mora, R., Aminpur, M., Hellig, K., Vishnubhotla, L., Solomentsev, Y., Arunachalam, V., Phillips, A., Junker, K., Filipiak, S., Ramani, N., Turner, M., Rendon, M., Molloy, J., McGuffin, K., Michel, A., Pena, R., Rose, D., Schmidt, J., Smith, M., Wilson, M., Terpolilli, L., Le, P., Sun, J., Ross, R., Yu, K., Hall, M., Ingersoll, P., Woo, M., Yeap, G., Lage, C.

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :11.4.1-11.4.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Tavel, B., Duriez, B., Gwoziecki, R., Basso, M.T., Julien, C., Ortolland, C., Laplanche, Y., Fox, R., Sabouret, E., Detcheverry, C., Boeuf, F., Morin, P., Barge, D., Bidaud, M., Biénacel, J., Garnier, P., Cooper, K., Chapon, J.D., Trouiller, Y., Belledent, J., Broekaart, M., Gouraud, P., Denais, M., Huard, V., Rochereau, K., Difrenza, R., Planes, N., Marin, M., Boret, S., Gloria, D., Vanbergue, S., Abramowitz, P., Vishnubhotla, L., Reber, D., Stolk, P., Woo, M., Arnaud, F.

المصدر: In Solid State Electronics 2006 50(4):573-578

المؤلفون: Gilmer, M. C., Luo, T. Y., Huff, H. R., Jackson, M. D., Kim, S., Bersuker, G., Zeitzoff, P., Vishnubhotla, L., Brown, G. A., Amos, R., Brady, D., Watt, V. H. C., Gale, G., Guan, J., Nguyen, B., Williamson, G., Lysaght, P., Torres, K., Geyling, F., Gondran, C. F. H., Fair, J. A., Schulberg, M. T., Tamagawa, T.

المصدر: MRS Online Proceedings Library. 567(1):323-341

المؤلفون: Karamcheti, A.^Aff145, Watt, V. H. C., Luo, T. Y., Brady, D., Shaapur, F., Vishnubhotla, L., Gale, G., Huff, H. R., Jackson, M. D., Torres, K., Diebold, A., Guan, J., Gilmer, M. C., Brown, G. A., Bersuker, G., Zeitzoff, P., Tamagawa, T., Guo, X., Wang, X. W., Ma, T. P.

المصدر: MRS Online Proceedings Library. 592(1):307-315

المؤلفون: Bienacel, J. ^*, Barge, D., Bidaud, M., Emonet, N., Roy, D., Vishnubhotla, L., Pouilloux, I., Barla, K.

المصدر: In Materials Science in Semiconductor Processing 2004 7(4):181-183