المؤلفون: Fei Mo, Jiawen Xiang, Xiaoran Mei, Yoshiki Sawabe, Takuya Saraya, Toshiro Hiramoto, Chun-Jung Su, Vita Pi-Ho Hu, Masaharu Kobayashi

المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 115-122 (2022)

مصطلحات موضوعية: Junctionless, FeFET, ferroelectric, HfO₂, GIDL, retention, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9677031/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/eafa049e2c034233909a0a15c81b3915

المؤلفون: Vita Pi-Ho Hu, Pin-Chieh Chiu, Yi-Chun Lu

المصدر: IEEE Journal of the Electron Devices Society, Vol 7, Pp 295-302 (2019)

مصطلحات موضوعية: Line-edge roughness, work function variation, negative capacitance FET (NCFET), ferroelectric properties, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8633374/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/a6ac98207f6b45658d5f5ad22f6cf642

المؤلفون: Vita Pi-Ho Hu

المصدر: IEEE Journal of the Electron Devices Society, Vol 5, Iss 2, Pp 107-111 (2017)

مصطلحات موضوعية: Reliability-tolerant, ultra-thin-body (UTB), GeOI, NBTI, PBTI, SRAM, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/7797165/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/aa2303a8573d46ef9d41f90eed29376f

المؤلفون: Yin-Nien Chen, Chien-Ju Chen, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang

المصدر: Journal of Low Power Electronics and Applications, Vol 5, Iss 2, Pp 101-115 (2015)

مصطلحات موضوعية: tunnel FET (TFET), FinFET, work function variation (WFV), line-edge-roughness (LER), carry-lookahead adder (CLA), Applications of electric power, TK4001-4102

وصف الملف: electronic resource

Relation: http://www.mdpi.com/2079-9268/5/2/101; https://doaj.org/toc/2079-9268

URL الوصول: https://doaj.org/article/9c5c3044a4a149f2a745d1ee16c2331c

المؤلفون: Chih-Wei Hsu, Ming-Long Fan, Vita Pi-Ho Hu, Pin Su

المصدر: IEEE Journal of the Electron Devices Society, Vol 3, Iss 3, Pp 194-199 (2015)

مصطلحات موضوعية: work-function variation (WFV), Heterojunction Tunnel FET (HTFET), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/7053925/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/5a3f387b22f34de9a5c77d6419693e21

المؤلفون: Chia-Hao Pao, Ming-Long Fan, Ming-Fu Tsai, Yin-Nien Chen, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang

المصدر: 2012 IEEE International Conference on IC Design & Technology IC Design & Technology (ICICDT), 2012 IEEE International Conference on. :1-4 May, 2012

Relation: 2012 IEEE International Conference on IC Design & Technology (ICICDT)

المؤلفون: Ming-Long Fan, Vita Pi-Ho Hu, Yin-Nien Chen, Pin Su, Ching-Te Chuang

المصدر: Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) VLSI Technology, Systems and Application (VLSI-TSA), Proceedings of Technical Program - 2014 International Symposium on. :1-2 Apr, 2014

Relation: 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

المؤلفون: Vita Pi-Ho Hu, Yu-Sheng Wu, Pin Su

المصدر: 2008 IEEE International Conference on Electron Devices and Solid-State Circuits Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on. :1-4 Dec, 2008

Relation: 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

المؤلفون: Ming-Fu Tsai, Ming-Long Fan, Chia-Hao Pao, Yin-Nien Chen, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang

المصدر: 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) VLSI Technology, Systems, and Applications (VLSI-TSA), 2013 International Symposium on. :1-2 Apr, 2013

Relation: 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

المؤلفون: Ming-Fu Tsai, Lu, Barney K., Fan, Ming-Long, Chia-Hao Pao, Yin-Nien Chen, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang

المصدر: Proceedings of Technical Program of 2012 VLSI Technology, System and Application VLSI Technology, Systems, and Applications (VLSI-TSA), 2012 International Symposium on. :1-2 Apr, 2012

Relation: 2012 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)