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1
المؤلفون: S. Friedrich, A. Marino, F. Ponce, M. F. Carpenter, G.-B. Kim, O. B. Drury, J. Drake, C. R. Bray, S. Fretwell, K. G. Leach, J. Harris, W. K. Warburton, J. A. Hall, R. Cantor
المصدر: Journal of Low Temperature Physics. 209:1063-1069
مصطلحات موضوعية: General Materials Science, Condensed Matter Physics, Atomic and Molecular Physics, and Optics
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2
المؤلفون: S, Friedrich, G B, Kim, C, Bray, R, Cantor, J, Dilling, S, Fretwell, J A, Hall, A, Lennarz, V, Lordi, P, Machule, D, McKeen, X, Mougeot, F, Ponce, C, Ruiz, A, Samanta, W K, Warburton, K G, Leach
المصدر: Physical review letters. 126(2)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::ff692ab44ef22b6f0563940299b555ca
https://pubmed.ncbi.nlm.nih.gov/33512206 -
3
المؤلفون: D. A. Darknell, W. K. Warburton, B. Hubbard-Nelson
المصدر: Journal of Radioanalytical and Nuclear Chemistry. 233:233-239
مصطلحات موضوعية: Materials science, Spectrometer, business.industry, Computer science, Preamplifier, Health, Toxicology and Mutagenesis, Detector, Public Health, Environmental and Occupational Health, Analytical chemistry, Pollution, Analytical Chemistry, Nuclear Energy and Engineering, Filter (video), Radiology, Nuclear Medicine and imaging, Instrumentation (computer programming), User interface, business, Spectroscopy, Computer hardware, Computer Automated Measurement and Control, Communication channel
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4
المؤلفون: W. K. Warburton, J. T. Harris
المصدر: 2011 IEEE Nuclear Science Symposium Conference Record.
مصطلحات موضوعية: Physics, Noise, Noise temperature, Noise generator, business.industry, Noise spectral density, Electrical engineering, Effective input noise temperature, Y-factor, Flicker noise, business, Noise floor
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3966a5ffbda646daf4911d9b0340c859
https://doi.org/10.1109/nssmic.2011.6154093 -
5
المؤلفون: A. T. Ortiz, M. Karnowski, W. K. Warburton, A. Williams, George H. Kwei
المصدر: Journal of Materials Research. 5:1197-1200
مصطلحات موضوعية: Diffraction, Materials science, Rietveld refinement, Mechanical Engineering, Neutron diffraction, Crystal structure, Condensed Matter Physics, Crystallography, Mechanics of Materials, X-ray crystallography, General Materials Science, Neutron, Powder diffraction, Electron backscatter diffraction
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6
المؤلفون: R. A. Kroeger, W. N. Johnson, J. D. Kurfess, M. Momayezi, W. K. Warburton, B. F. Phlips, Paul N. Luke
المصدر: AIP Conference Proceedings.
مصطلحات موضوعية: Physics, Optics, High-energy astronomy, Observatory, business.industry, Astrophysics::High Energy Astrophysical Phenomena, Compton telescope, Detector, Gamma ray, Gamma-ray astronomy, Sensitivity (control systems), business, Image resolution
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7
المؤلفون: W. K. Warburton
المصدر: MRS Proceedings. 487
مصطلحات موضوعية: Optics, Materials science, Pixel, business.industry, Resolution (electron density), X-ray detector, business, Image resolution, Noise (electronics), Energy (signal processing), Particle detector, Semiconductor detector
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8
المؤلفون: B. M. Cohen, W. K. Warburton, D. Turnbull
المصدر: Physical Review B. 16:2491-2503
مصطلحات موضوعية: Multiple point, Materials science, Condensed matter physics, Electrical resistivity and conductivity
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d9c73199b59873cfad65e5972e54df3
https://doi.org/10.1103/physrevb.16.2491 -
9
المؤلفون: B. M. Cohen, W. K. Warburton
المصدر: Physical Review B. 12:5682-5688
مصطلحات موضوعية: Materials science, Analytical chemistry, Thermal diffusivity
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::79d1c5451c212b264dfa06b9a4a6e0e1
https://doi.org/10.1103/physrevb.12.5682 -
10
المؤلفون: W. K. Warburton, M. Wang, Jan S. Iwanczyk, B. Hedman, N. Dorri, M. Szawlowski, K. O. Hodgson
المصدر: Review of Scientific Instruments. 60:1561-1567
مصطلحات موضوعية: Optics, Materials science, Preamplifier, business.industry, Amplifier, Detector, Resolution (electron density), Synchrotron radiation, Electronics, Breadboard, business, Instrumentation, Image resolution