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1
المؤلفون: Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dc2e7effeb63e0564acf63299000578e
https://doi.org/10.1109/irps48203.2023.10117740 -
2
المؤلفون: Maximilian W. Feil, Hans Reisinger, André Kabakow, Thomas Aichinger, Christian Schleich, Aleksandr Vasilev, Dominic Waldhör, Michael Waltl, Wolfgang Gustin, Tibor Grasser
المصدر: Communications Engineering. 2
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3دورية أكاديمية
المؤلفون: Maximilian W. Feil, Andreas Huerner, Katja Puschkarsky, Christian Schleich, Thomas Aichinger, Wolfgang Gustin, Hans Reisinger, Tibor Grasser
المصدر: Crystals, Vol 10, Iss 12, p 1143 (2020)
مصطلحات موضوعية: hysteresis, device parameters, reproducibility, device characteristics, silicon carbide, threshold voltage, Crystallography, QD901-999
وصف الملف: electronic resource
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4
المؤلفون: Maximilian W. Feil, Hans Reisinger, Dominic Waldhoer, Michael Waltl, Tibor Grasser, Katja Waschneck, Christian Schleich
المصدر: IEEE Transactions on Electron Devices. 68:4016-4021
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Trapping, Temperature measurement, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), chemistry.chemical_compound, chemistry, MOSFET, Silicon carbide, Optoelectronics, Transient (oscillation), Electrical and Electronic Engineering, business
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5
المؤلفون: Maximilian W. Feil, Hans Reisinger, Andre Kabakow, Thomas Aichinger, Wolfgang Gustin, Tibor Grasser
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7c8701b2f2fabb88c28e9eaa601dbe0a
https://doi.org/10.1109/irps48227.2022.9764584 -
6
المصدر: IEEE Transactions on Electron Devices. 68:236-243
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Time constant, Activation energy, 01 natural sciences, Temperature measurement, Signal, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), Acceleration, 0103 physical sciences, MOSFET, Electrical and Electronic Engineering
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7
المؤلفون: He Huang, Alexander F. Richter, Bert Nickel, Maximilian W. Feil, Yiou Wang, Tushar Debnath, Linzhong Wu, Markus Döblinger, Simon Fuchs, Yu Tong
المصدر: Chemistry of Materials
مصطلحات موضوعية: Materials science, Field (physics), General Chemical Engineering, Halide, Nanotechnology, 02 engineering and technology, General Chemistry, In situ spectroscopy, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, Metal, Nanocrystal, visual_art, Materials Chemistry, visual_art.visual_art_medium, 0210 nano-technology, Perovskite (structure)
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8
المؤلفون: Agustín Mihi, He Huang, Aurora Manzi, Lakshminarayana Polavarapu, Maximilian W. Feil, Jochen Feldmann, David Vila-Liarte, Markus Döblinger, Juan Luis Garcia-Pomar, Luis M. Liz-Marzán
المصدر: Angewandte Chemie. 132:17903-17909
مصطلحات موضوعية: 02 engineering and technology, General Medicine, 010402 general chemistry, 021001 nanoscience & nanotechnology, 0210 nano-technology, 01 natural sciences, 0104 chemical sciences
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9
المؤلفون: He Huang, Yu Tong, Lakshminarayana Polavarapu, Yanxiu Li, En-Ping Yao, Maximilian W. Feil, Jochen Feldmann, Alexander F. Richter, Andrey L. Rogach, Markus Döblinger
المصدر: Angewandte Chemie. 131:16710-16715
مصطلحات موضوعية: Materials science, 010405 organic chemistry, General Medicine, 010402 general chemistry, 01 natural sciences, 0104 chemical sciences
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10
المؤلفون: Gerald Rescher, Katja Waschneck, Hans Reisinger, Thomas Aichinger, Maximilian W. Feil, P. Salmen
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Test procedures, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Stability (probability), Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), chemistry, Stress test, 0103 physical sciences, MOSFET, Silicon carbide, 0210 nano-technology, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7126ada1b4702033392bceecb19da26b
https://doi.org/10.1109/irps46558.2021.9405207