-
1
المؤلفون: G. Boudreault, T.D.M. Weijers, Heiko Timmers, Y.Q. Wang, R. Grötzschel, Robert Elliman, Eero Rauhala, Chris Jeynes, W. N. Lennard, S. C. Gujrathi, Timo Sajavaara
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 222:547-566
مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Physics::Instrumentation and Detectors, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Fluence, Ion, Elastic recoil detection, Secondary ion mass spectrometry, Time of flight, chemistry, Nuclear reaction analysis, 0103 physical sciences, Wafer, Atomic physics, 0210 nano-technology, Instrumentation, Helium
-
2
المؤلفون: W. N. Lennard, Sven Tougaard, N. S. McIntyre, B. A. Kobe, Andrew P. Grosvenor
المصدر: Surface and Interface Analysis. 36:632-639
مصطلحات موضوعية: Mean free path, Analytical chemistry, Iron oxide, Oxide, Surfaces and Interfaces, General Chemistry, Substrate (electronics), Condensed Matter Physics, Inelastic mean free path, Surfaces, Coatings and Films, chemistry.chemical_compound, chemistry, X-ray photoelectron spectroscopy, Nuclear reaction analysis, Materials Chemistry, Magnetite
-
3
المؤلفون: Cedric Huyghebaert, Günther Dollinger, Matty Caymax, Wilfried Vandervorst, W. N. Lennard, André Vantomme, Sophie Nauwelaerts, Kenji Kimura, Andreas Bergmaier, Kaoru Nakajima, Guy Terwagne, Bert Brijs
المصدر: Brijs, B, Huyghebaert, C, Nauwelaerts, S, Caymax, M, Vandervorst, W, Nakajima, K, Kimura, K, Bergamier, A, Döllinger, G, Lennard, W N, Terwagne, G & Vantomme, A 2002, ' Advanced characterization of high-k materials: a nuclear approach ', Nuclear instruments and methods in physics research, vol. 190, pp. 505-509 .
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, thin film, High-k, Analytical chemistry, chemistry.chemical_element, elastic recoil detection, high-k, symbols.namesake, Nuclear reaction analysis, Microelectronics, Thin film, Rutherford scattering, Instrumentation, Elastic recoil detection, Zirconium, Rutherford backscattering, business.industry, Rutherford backscattering spectrometry, Characterization (materials science), chemistry, nuclear reaction analysis, symbols, business
وصف الملف: application/pdf
-
4
المؤلفون: T.R. Ophel, Heiko Timmers, S.R. Walker, Peter Mascher, S.G. Wallace, G.R. Massoumi, W. N. Lennard, John A. Davies, Robert Elliman
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 170:461-466
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Silicon oxynitride, Ion beam analysis, Silicon, Ion beam, Analytical chemistry, chemistry.chemical_element, Elastic recoil detection, chemistry.chemical_compound, chemistry, Silicon nitride, Nuclear reaction analysis, Atomic physics, Thin film, Instrumentation
-
5
المؤلفون: G.R. Massoumi, Masoud Kasrai, G. M. Bancroft, L. Rodriguez Fernandez, M.L. Suominen Fuller, W. N. Lennard
المصدر: Tribology Letters. 8:187-192
مصطلحات موضوعية: X-ray absorption spectroscopy, Materials science, Calibration curve, Mechanical Engineering, Abrasive, Analytical chemistry, Surfaces and Interfaces, XANES, Surfaces, Coatings and Films, Rubbing, Mechanics of Materials, Particle, Absorption (electromagnetic radiation), Spectroscopy
-
6
المؤلفون: A Le Padellec, W N Lennard, Dahbia Talbi, J. B. A. Mitchell, C Sheehan
المصدر: Journal of Physics B: Atomic, Molecular and Optical Physics. 32:3347-3360
مصطلحات موضوعية: Physics, Valence (chemistry), Excited state, Electron, Atomic physics, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Recombination, Dissociative recombination, Dissociation (chemistry), Ion
-
7
المؤلفون: C.-S. Zhang, W. N. Lennard, Z. Qin, Keith Griffiths, Peter R. Norton
المصدر: Journal of Nuclear Materials. 264:228-233
مصطلحات موضوعية: Nuclear reaction, Nuclear and High Energy Physics, Nuclear Energy and Engineering, Ion beam, Deuterium, Chemistry, Desorption, Nuclear reaction analysis, Ultra-high vacuum, Zirconium alloy, Analytical chemistry, General Materials Science, Mass spectrometry
-
8
المؤلفون: Ian V. Mitchell, S. Chang, L. J. Huang, Y. Hung, W. N. Lennard, G.R. Massoumi
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:2196-2201
مصطلحات موضوعية: chemistry.chemical_classification, Hydrogen, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Condensed Matter Physics, Mass spectrometry, Surfaces, Coatings and Films, Secondary ion mass spectrometry, chemistry.chemical_compound, chemistry, Nuclear reaction analysis, Compounds of carbon, Carbon nitride, Carbon, Stoichiometry
-
9
المؤلفون: J.H. Horton, T. Cheng, W. N. Lennard, Joseph G. Shapter, Peter R. Norton
المصدر: Surface Science. 375:171-182
مصطلحات موضوعية: Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Chemical vapor deposition, Condensed Matter Physics, Copper, Surfaces, Coatings and Films, Adsorption, chemistry, X-ray photoelectron spectroscopy, Monolayer, Materials Chemistry, Physical chemistry, Molecule, Spectroscopy, Ultraviolet photoelectron spectroscopy
-
10
المؤلفون: Jennifer A. Bardwell, Masoud Kasrai, G. M. Bancroft, R.W. Brunner, W. N. Lennard, Kim H. Tan
المصدر: Applied Surface Science. 99:303-312
مصطلحات موضوعية: Absorption spectroscopy, Chemistry, Analytical chemistry, General Physics and Astronomy, Sampling (statistics), Surfaces and Interfaces, General Chemistry, Electron, Condensed Matter Physics, Spectral line, XANES, Surfaces, Coatings and Films, K-edge, Thin film, Absorption (electromagnetic radiation)