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المؤلفون: P. W. Gorham, Andrea M. Ghez, Keith Matthews, G. Neugebauer, Shrinivas R. Kulkarni, Christopher A. Haniff, W. Nicholas Weir
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, business.industry, Speckle noise, Iterative reconstruction, Speckle pattern, symbols.namesake, Optics, Fourier transform, Fourier analysis, symbols, Bispectral analysis, Computer vision, Speckle imaging, Artificial intelligence, Deconvolution, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::09dca5242859ed7f4529d73ee0c78529
https://doi.org/10.1117/12.19298