المؤلفون: Filippi, R.G., McGrath, J.F., Shaw, T.M., Murray, C.E., Rathore, H.S., McLaughlin, P.S., McGahay, V., Nicholson, L., Wang, P.-C., Lloyd, J.R., Lane, M., Rosenberg, R., Liu, X., Wang, Y.-Y., Landers, W., Spooner, T., Demarest, J.J., Engel, B.H., Gill, J., Goth, G., Barth, E., Biery, G., Davis, C.R., Wachnik, R.A., Goldblatt, R., Ivers, T., Swinton, A., Barile, C., Aitken, J.

المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings Reliability physics Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International. :61-67 2004

Relation: 2004 IEEE International Reliability Physics Symposium. Proceedings

المؤلفون: Yu Cao, Groves, R.A., Zamdmer, N.D., Plouchart, J.-O., Wachnik, R.A., Xuejue Huang, King, T.-J., Chenming Hu

المصدر: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) Custom integrated circuits conference Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002. :217-220 2002

Relation: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference

المؤلفون: Yu Cao, Groves, R.A., Xuejue Huang, Zamdmer, N.D., Plouchart, J.-O., Wachnik, R.A., Tsu-Jae King, Chenming Hu

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 38(3):419-426 Mar, 2003

المؤلفون: Goldblatt, R.D., Agarwala, B., Anand, M.B., Barth, E.P., Biery, G.A., Chen, Z.G., Cohen, S., Connolly, J.B., Cowley, A., Dalton, T., Das, S.K., Davis, C.R., Deutsch, A., DeWan, C., Edelstein, D.C., Emmi, P.A., Faltermeier, C.G., Fitzsimmons, J.A., Hedrick, J., Heidenreich, J.E., Hu, C.K., Hummel, J.P., Jones, P., Kaltalioglu, E., Kastenmeier, B.E., Krishnan, M., Landers, W.F., Liniger, E., Liu, J., Lustig, N.E., Malhotra, S., Manger, D.K., McGahay, V., Mih, R., Nye, H.A., Purushothaman, S., Rathore, H.A., Seo, S.C., Shaw, T.M., Simon, A.H., Spooner, T.A., Stetter, M., Wachnik, R.A., Ryan, J.G.

المصدر: Proceedings of the IEEE 2000 International Interconnect Technology Conference (Cat. No.00EX407) Interconnect technology Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International. :261-263 2000

Relation: Proceedings of the IEEE 2000 International Interconnect Technology Conference

المؤلفون: Stathis, J.H., Vayshenker, A., Varekamp, P.R., Wu, E.Y., Montrose, C., McKenna, J., DiMaria, D.J., Han, L.-K., Cartier, E., Wachnik, R.A., Linder, B.P.

المصدر: 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :94-95 2000

Relation: 2000 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Linder, B.P., Stathis, J.H., Wachnik, R.A., Wu, E., Cohen, S.A., Ray, A., Vayshenker, A.

المصدر: 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :214-215 2000

Relation: 2000 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Wachnik, R.A., Filippi, R.G., Shaw, T.M., Lin, P.C.

المصدر: 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) VLSI technology VLSI Technology, 2000. Digest of Technical Papers. 2000 Symposium on. :220-221 2000

Relation: 2000 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Wachnik, R.A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 33(7):1054-1061 Jul, 1986

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