المؤلفون: Verlinde, M., Kraemer, S., Moens, J., Chrysaldis, K., Correia, J. G., Cottenier, S., De Witte, H., Fedorov, D. V., Fedosseev, V. N, Ferrer, R., Fraile, L. M., Geldhof, S., Granados, C. A., Laatiaoui, M., Lima, T. A. L., Lin, P-C, Manea, V., Marsh, B. A., Moore, I., Pereira, L. M. C., Raeder, S., Bergh, P. Van den, Van Duppen, P., Vantomme, A., Verstraelen, E., Wahl, U., Wilkins, S. G.

المصدر: Phys. Rev. C 100, 024315 (2019)

مصطلحات موضوعية: Nuclear Experiment

URL الوصول: http://arxiv.org/abs/1904.10245

المؤلفون: Wahl, U.^{Aff1, IDs0011302101127y_cor1}, Ochsmann, E., Siemers, F., Corterier, C. C., Hirsch, T.

المصدر: Der Unfallchirurg: Organ der Deutschen Gesellschaft für Unfallchirurgie. 125(4):327-335

المؤلفون: David-Bosne, E., Wahl, U., Miranda, P.A., Ribeiro da Silva, M., Alves, E., Correia, J.G.

المصدر: In Nuclear Inst. and Methods in Physics Research, B 15 July 2021 499:61-69

المؤلفون: Deboy, G., Hancock, J., Purschel, M., Wahl, U., Willmeroth, A.

المصدر: APEC. Seventeenth Annual IEEE Applied Power Electronics Conference and Exposition (Cat. No.02CH37335) Applied power electronics conference Applied Power Electronics Conference and Exposition, 2002. APEC 2002. Seventeenth Annual IEEE. 2:988-993 vol.2 2002

Relation: Proceedings of APEC 2002 - Applied Power Electronics Conference and Exposition

المؤلفون: David-Bosne, E., Wahl, U., Correia, J.G., Lima, T.A.L., Vantomme, A., Pereira, L.M.C.

المصدر: In Nuclear Inst. and Methods in Physics Research, B 1 January 2020 462:102-113

المؤلفون: Wahl, U.^Aff1, Kaulbars, U., Ernst, F., Hirsch, T.

المصدر: Trauma und Berufskrankheit. 21(4):276-285

المؤلفون: Silva, D.J., Wahl, U., Correia, J.G., Augustyns, V., Lima, T.A.L., Costa, A., Bosne, E., da Silva, M.R., Araújo, J.P., Pereira, L.M.C.

المصدر: In Nuclear Inst. and Methods in Physics Research, B 15 March 2016 371:59-62

المؤلفون: Pereira, LMC, Wahl, U, Correia, JG, Biesmans, B, Costa, ARG, da Silva, MR, David Bosne, E, Lamelas, A, Magchiels, G, Moens, J, Tunhuma, SM, Villarreal, R, Vantomme, A, Amaral, V, Corte, E, Ditalia Tchernij, S, Forneris, J, Green, B, Johnston, K, Nieto Hernandez, E, Olivero, P, Pugliese, V

مصطلحات موضوعية: Detectors and Experimental Techniques

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od________65::441c499e09a2f0720386a7441b556fd8
http://cds.cern.ch/record/2845693

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المؤلفون: Chirilă, T., Kaindl, W., Reimann, T., Rüb, M., Wahl, U.

المصدر: In Microelectronics Reliability August-September 2015 55(9-10):1481-1485