يعرض 1 - 10 نتائج من 285 نتيجة بحث عن '"Wallash, A."', وقت الاستعلام: 0.96s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Impact of Miniature H-Field Probe on Measured Fields

    المؤلفون: Nesterova, M., Wallash, A.

    المصدر: IEEE Letters on Electromagnetic Compatibility Practice and Applications IEEE Lett. on Electromagn. Compat. Pract. and Appl. Electromagnetic Compatibility Practice and Applications, IEEE Letters on. 2(1):11-14 Mar, 2020

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  2. 2
    مؤتمر
    Impact of Miniature H-field Probe on Measured Fields

    المؤلفون: Nesterova, Maryna, Wallash, Albert

    المصدر: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI), 2019 IEEE International Symposium on. :333-334 Jul, 2019

    Relation: 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI)

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  3. 3
    مؤتمر
    A study of EMI from patterned ground structures

    المؤلفون: Wallash, Albert, Nguyen, Jack

    المصدر: 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on. :97-100 Mar, 2015

    Relation: 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity

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  4. 4
    مؤتمر
    Measurement, simulation and reduction of EOS damage by electrical fast transients on AC power

    المؤلفون: Wallash, Al, Kraz, Vladimir

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd. :1-6 Oct, 2010

    Relation: 2010 32nd Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD)

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  5. 5
    مؤتمر
    ESD challenges in magnetic recording: past, present and future

    المؤلفون: Wallash, A.

    المصدر: 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :222-228 2003

    Relation: International Reliability Physics Symposium

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  6. 6
    دورية أكاديمية
    Analysis of RF Signal Interference Invasion Into Hard Disk Drive System and Coupled to Read Front-End System

    المؤلفون: Nishiyama, N., Soga, Y., Contreras, J. T., Wallash, A., Nakamura, S.

    المصدر: IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 49(7):3783-3786 Jul, 2013

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  7. 7
    مؤتمر
    The effects of EMI from cell phones on GMR magnetic recording heads and test equipment

    المؤلفون: Kraz, V., Wallash, A.

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :224-232 2000

    Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

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  8. 8
    مؤتمر
    In-situ spin stand ESD testing of giant magnetoresistive (GMR) recording heads

    المؤلفون: Wallash, A.

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :349-354 2000

    Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

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  9. 9
    مؤتمر
    Considerations for an HBM ESD standard for measuring and testing of magneto resistive heads

    المؤلفون: Henry, L.G., Wallash, A.

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :337-342 2000

    Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

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  10. 10
    مؤتمر
    ESD evaluation of tunneling magnetoresistive (TMR) devices

    المؤلفون: Wallash, A., Hillman, J., Dexin Wang

    المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Electrical overstress/electrostatic discharge symposium Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000. :470-474 2000

    Relation: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

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