المؤلفون: Patel, K. M., Udintsev, V. S., Vayakis, G., Giacomin, T., Johnson, D., Maquet, Ph., Pandya, H. K. B., Penot, C., Portales, M., Proust, M., Oosterbeek, J. W., Vershkov, V., Walsh, M. J.

المصدر: 2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on. :637-640 Sep, 2014

Relation: 2014 International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)

المؤلفون: Walsh, M. J., Reddy, R. K., Bhargava, R.

المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 18(4):1502-1513 Aug, 2012

المؤلفون: Shibaev, S., Naylor, G., Scannell, R., McArdle, G. J., Walsh, M. J.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 58(4):1516-1521 Aug, 2011

المؤلفون: Meszaros, B., Porempovics, G., Walsh, M. J.

المصدر: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 38(3):306-310 Mar, 2010

المؤلفون: Korsunsky, A. M.^Aff4, Dini, D.^Aff5, Walsh, M. J.^Aff6

المساهمون: Gladwell, G. M. L., editor^Aff1, Sih, G. C., editor^{Aff2, Aff3}

المصدر: Multiscale Fatigue Crack Initiation and Propagation of Engineering Materials: Structural Integrity and Microstructural Worthiness : Fatigue Crack Growth Behaviour of Small and Large Bodies. 152:47-64

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المؤلفون: Conway, N. J.^Aff4, Carolan, P. G.^Aff4, Field, A. R.^Aff4, Meyer, H.^Aff4, Walsh, M. J.^Aff5

المساهمون: Stott, Peter E., editor^Aff1, Wootton, Alan, editor^Aff2, Gorini, Giuseppe, editor^Aff3, Sindoni, Elio, editor^Aff3, Batani, Dimitri, editor^Aff3

المصدر: Advanced Diagnostics for Magnetic and Inertial Fusion. :249-252

المؤلفون: Lang, U E, Kocabayoglu, P, Cheng, G Z^{Aff1, Aff4}, Ghiassi-Nejad, Z, Muñoz, U, Vetter, D, Eckstein, D A, Hannivoort, R A^{Aff1, Aff4}, Walsh, M J, Friedman, S L^{Aff1, IDonc2012457_cor10}

المصدر: Oncogene. 32(38):4557-4564

المؤلفون: Fogel, L. J., Owens, A. J., Walsh, M. J.

المصدر: IEEE Transactions on Human Factors in Electronics IEEE Trans. Hum. Factors Electron. Human Factors in Electronics, IEEE Transactions on. HFE-6(1):13-23 Sep, 1965

المؤلفون: Manuela Studer-Karlen, Thomas Kaffenberger, Walsh, M. J. K., Schmid, W.

المصدر: Manuela Studer-Karlen

مصطلحات موضوعية: 700 Arts

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9d7fa885ce3c4c4eed7352a8e2899200