المؤلفون: Grasser, T., Feil, M.W., Waschneck, K., Reisinger, H., Berens, J., Waldhoer, D., Vasilev, A., Waltl, M., Aichinger, T., Bockstedte, M., Gustin, W., Pobegen, G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4218-4226 Jul, 2024

المؤلفون: Feil, M.W., Waschneck, K., Reisinger, H., Berens, J., Aichinger, T., Prigann, S., Pobegen, G., Salmen, P., Rescher, G., Waldhoer, D., Vasilev, A., Gustin, W., Waltl, M., Grasser, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(7):4210-4217 Jul, 2024

المؤلفون: Waltl, M., Stampfer, B., Grasser, T.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):168-173 Jun, 2024

المؤلفون: Stampfer, P., Roger, F., Cvitkovich, L., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):161-167 Jun, 2024

المؤلفون: Provias, A., Knobloch, T., Kitamura, A., O'Brien, K. P., Dorow, C. J., Waldhoer, D., Stampfer, B., Penumatcha, A. V., Lee, S., Ramamurthy, R., Clendenning, S., Waltl, M., Avci, U., Grasser, T.

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Stampfer, P., Roger, F., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(11):5738-5744 Nov, 2023

المؤلفون: Tselios, K., Knobloch, T., Waldhoer, D., Stampfer, B., Ioannidis, E., Enichlmair, H., Minixhofer, R., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):355-362 Sep, 2023

المؤلفون: Grasser, T., Feil, M., Waschneck, K., Reisinger, H., Berens, J., Waldhoer, D., Vasilev, A., Waltl, M., Aichinger, T., Bockstedte, M., Gustin, W., Pobegen, G.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :3B.1-1-3B.1-7 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Stampfer, P., Stampfer, B., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4320-4325 Aug, 2023

المؤلفون: Stampfer, P., Stampfer, B., Grasser, T., Waltl, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4326-4331 Aug, 2023