المؤلفون: Hu, Yu-Pang, Chang, Shuo-Wen, Wu, Kai-Chiang, Wang, Chi Chun, Huang, Fu-Sheng, Tang, Yi-Lun, Chen, Yung-Chen, Chen, Ming-Chien, Chao, Mango C.-T.

المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :106-111 Sep, 2020

Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Wang, Laung-Terng, Apte, Ravi, Wu, Shianling, Sheu, Boryau, Lee, Kuen-Jong, Wen, Xiaoqing, Jone, Wen-Ben, Yeh, Chia-Hsien, Wang, Wei-Shin, Chao, Hao-Jan, Guo, Jianghao, Liu, Jinsong, Niu, Yanlong, Sung, Yi-Chih, Wang, Chi-Chun, Li, Fangfang

المصدر: 2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-9 Oct, 2008

Relation: 2008 IEEE International Test Conference (ITC)

المؤلفون: Wang, Laung-Terng, Apte, Ravi, Wu, Shianling, Sheu, Boryau, Lee, Kuen-Jong, Wen, Xiaoqing, Jone, Wen-Ben, Guo, Jianghao, Wang, Wei-Shin, Chao, Hao-Jan, Liu, Jinsong, Niu, Yanlong, Sung, Yi-Chih, Wang, Chi-Chun, Li, Fangfang

المصدر: IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 26(1):26-35 Jan, 2009

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تسجيل الدخول للوصول الكامل.

المؤلفون: Wang, Laung-Terng, Apte, Ravi, Wu, Shianling, Sheu, Boryau, Lee, Kuen-Jong, Wen, Xiaoqing, Jone, Wen-Ben, Guo, Jianghao, Wang, Wei-Shin, Chao, Hao-Jan, Un, Jinsong, Niu, Yanlong, Sung, Yi-Chih, Wang, Chi-Chun, Li, Fangfang

المصدر: IEEE Design & Test of Computers; Jan/Feb2009, Vol. 26 Issue 1, p26-35, 10p, 1 Black and White Photograph, 4 Diagrams, 1 Chart

مصطلحات موضوعية: AUTOMATION, COMPUTER input-output equipment, STANDARDS, COMPUTER storage devices

الشركة/الكيان: INSTITUTE of Electrical & Electronics Engineers