-
1مؤتمر
المؤلفون: Chao, Wei-Ji, Kourfali, Alexandra, Lylina, Natalia, Wu, Jun-Tsung, Yang, Jing-An, Wang, Chih-Hao, Hsieh, Tong-Yu, Wunderlich, Hans-Joachim
المصدر: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) Technology, Systems and Applications (VLSI TSA), 2024 International VLSI Symposium on. :1-4 Apr, 2024
Relation: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)
-
2مؤتمر
المؤلفون: Habiby, Payam, Lylina, Natalia, Wang, Chih-Hao, Wunderlich, Hans-Joachim, Huhn, Sebastian, Drechsler, Rolf
المصدر: 2023 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2023 IEEE. :1-6 May, 2023
Relation: 2023 IEEE European Test Symposium (ETS)
-
3مؤتمر
المؤلفون: Lylina, Natalia, Wang, Chih-Hao, Wunderlich, Hans-Joachim
المصدر: 2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :78-83 Nov, 2022
Relation: 2022 IEEE 31st Asian Test Symposium (ATS)
-
4مؤتمر
المؤلفون: Lylina, Natalia, Wang, Chih-Hao, Wunderlich, Hans-Joachim
المصدر: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :1149-1152 Mar, 2022
Relation: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
-
5مؤتمر
المؤلفون: Lylina, Natalia, Wang, Chih-Hao, Wunderlich, Hans-Joachim
المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :20-29 Oct, 2021
Relation: 2021 IEEE International Test Conference (ITC)
-
6مؤتمر
المصدر: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-7 Jun, 2021
Relation: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
-
7تقرير
المؤلفون: Chen, Chonghan, Jiang, Qi, Wang, Chih-Hao, Chen, Noel, Wang, Haohan, Li, Xiang, Raj, Bhiksha
مصطلحات موضوعية: Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning
URL الوصول: http://arxiv.org/abs/2206.09114
-
8دورية أكاديمية
المؤلفون: Wang, Chih-Hao, Chen, NaAff2, IDs11069023062728_cor2, Olwert, Craig
المصدر: Natural Hazards. 120(2):1785-1807
-
9مؤتمر
المصدر: 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020
Relation: 2020 IEEE International Test Conference (ITC)
-
10مؤتمر
المصدر: 2020 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2020 IEEE International Symposium on. :1-5 Oct, 2020
Relation: 2020 IEEE International Symposium on Circuits and Systems (ISCAS)
Full Text Finder 
Find this article in full text from Springer Verlag.