المؤلفون: Mei, E.M., Sun, L.T., You, W., Liang, Y., Ou, X.J., Tong, Y.J., Qin, X.Q., Zheng, S.J., Zhang, X., Zhang, J.J., Yang, T.L., Ni, D.S., Wang, X.D., Wang, L.S., Yang, Y.B., Wu, B.M., Chen, Y.Q., Zhu, L., Lu, J.Q., Chen, Y., Yao, Q.G., Yang, W.J., Wu, W.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 32(6):1-5 Sep, 2022

المؤلفون: Hong, T., Lin, C., Huang, W., Li, K.S., Wang, L.S., Lin, J.C.

المصدر: IEEE Access Access, IEEE. 8:153692-153706 2020

المؤلفون: Li, S.N., Huang, J.C., Ma, B.B., Yan, B.H., Liang, Z.T., Wang, L.S.

المصدر: In Nuclear Engineering and Design 1 December 2023 414

المؤلفون: Li, Y.X., Moreira, V.R., Wang, L.S., Liu, Q.L., Gao, P.D., Zhang, X.J., Fu, X.

المصدر: In Animal Feed Science and Technology September 2023 303

المؤلفون: Guo, Q., Fu, P., Gao, G., Jiang, L., Wang, L.S., Bai, Y.R.

المصدر: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 46(5):1227-1233 May, 2018

المؤلفون: Wang, L.S., Yan, B.H.

المصدر: In Annals of Nuclear Energy 15 December 2021 164

المؤلفون: Wang, L.S., Yan, B.H.

المصدر: In Annals of Nuclear Energy October 2021 161

المؤلفون: Wang, R.C.J., Shih, J.R., Chu, L.H., Doong, K.Y.Y., Wang, L.S., Weil, P.C., Su, D.S., Yang, C.T., Chiu, C.C., Su, D., Peng, Y.K., Yue, J.T., Lee, J.Y.M.

المصدر: Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the. :23-26 2002

Relation: Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Wang, L.S., Wei, P.C., Chan, T.S., Chang, Y.P., Yen, C.L., Yang, W.C., Kuan, H.

المصدر: 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538) Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2001 6th International Symposium on. :29-32 2001

Relation: 2001 6th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Chiang, Y.T., Chang, F.R., Wang, L.S., Jan, Y.W., Ting, L.H.

المصدر: SICE 2001. Proceedings of the 40th SICE Annual Conference. International Session Papers (IEEE Cat. No.01TH8603) SICE 2001 SICE 2001. Proceedings of the 40th SICE Annual Conference. International Session Papers. :234-239 2001

Relation: SICE 2001. Proceedings of the 40th SICE Annual Conference. International Session Papers