المؤلفون: Chun-Yung Sung, Haizhou Yin, Ng, H.Y., Saenger, K.L., Chan, V., Crowder, S.W., Jinghong Li, Ott, J.A., Bendernagel, R., Kempisty, J.J., Victor Ku, Lee, H.K., Zhijiong Luo, Madan, A., Mo, R.T., Nguyen, P.Y., Pfeiffer, G., Raccioppo, M., Rovedo, N., Sadana, D., de Souza, J.P., Rong Zhang, Zhibin Ren, Wann, C.H.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :225-228 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Taur, Y., Wann, C.H., Frank, D.J.

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :789-792 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: Yang, H.S., Malik, R., Narasimha, S., Li, Y., Divakaruni, R., Agnello, P., Allen, S., Antreasyan, A., Arnold, J.C., Bandy, K., Belyansky, M., Bonnoit, A., Bronner, G., Chan, V., Chen, X., Chen, Z., Chidambarrao, D., Chou, A., Clark, W., Crowder, S.W., Engel, B., Harifuchi, H., Huang, S.F., Jagannathan, R., Jamin, F.F., Kohyama, Y., Kuroda, H., Lai, C.W., Lee, H.K., Lee, W.-H., Lim, E.H., Lai, W., Mallikarjunan, A., Matsumoto, K., McKnight, A., Nayak, J., Ng, H.Y., Panda, S., Rengarajan, R., Steigerwalt, M., Subbanna, S., Subramanian, K., Sudijono, J., Sudo, G., Sun, S.-P., Tessier, B., Toyoshima, Y., Tran, P., Wise, R., Wong, R., Yang, I.Y., Wann, C.H., Su, L.T., Horstmann, M., Feudel, Th., Wei, A., Frohberg, K., Burbach, G., Gerhardt, M., Lenski, M., Stephan, R., Wieczorek, K., Schaller, M., Salz, H., Hohage, J., Ruelke, H., Klais, J., Huebler, P., Luning, S., van Bentum, R., Grasshoff, G., Schwan, C., Ehrichs, E., Goad, S., Buller, J., Krishnan, S., Greenlaw, D., Raab, M., Kepler, N.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :1075-1077 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Wann, C.H.-J., Chenming Hu

المصدر: Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :867-870 1995

Relation: Proceedings of International Electron Devices Meeting

المؤلفون: Wann, C.H., Noda, K., Tanaka, T., Yoshida, M., Chenming Hu

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 43(10):1742-1753 Oct, 1996

المؤلفون: Park, D.-G., Luo, Z.J., Edleman, N., Zhu, W., Nguyen, P., Wong, K., Cabral, C., Jamison, P., Lee, B.H., Chou, A., Chudzik, M., Bruley, J., Gluschenkov, O., Ronsheim, P., Chakravarti, A., Mitchell, R., Ku, V., Kim, H., Duch, E., Kozlowski, P., D'Emic, C., Narayanan, V., Steegen, A., Wise, R., Jammy, R., Rengarajan, R., Ng, H., Sekiguchi, A., Wann, C.H.

المصدر: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :186-187 2004

Relation: 2004 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Wann, C.H., Tu, R., Bin Yu, Chenming Hu, Noda, K., Tanaka, T., Yoshida, M., Hui, K.

المصدر: 1996 Symposium on VLSI Technology. Digest of Technical Papers VLSI technology VLSI Technology, 1996. Digest of Technical Papers. 1996 Symposium on. :32-33 1996

Relation: 1996 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Lin, H.-K., Lin, Y.-C., Huang, F.-H., Fan, T.-W., Chiu, P.-C., Chyi, J.-I., Ko, C.-H., Kuan, T.-M., Hsieh, M.-K., Lee, W.-C., Wann, C.H.

المصدر: In Solid State Electronics April 2010 54(4):475-478

المؤلفون: Lin, H.-K., Fan, D.-W., Lin, Y.-C., Chiu, P.-C., Chien, C.-Y., Li, P.-W., Chyi, J.-I., Ko, C.-H., Kuan, T.-M., Hsieh, M.-K., Lee, W.-C., Wann, C.H.

المصدر: In Solid State Electronics 2010 54(5):505-508

المؤلفون: Wei-Zhi He, Heng-Kuang Lin, Pei-Chin Chiu, Jen-Inn Chyi, Chih-Hsin Ko, Ta-Ming Kuan, Meng-Kuei Hsieh, Wen-Chin Lee, Wann, C.H.

المصدر: 2010 International Conference on Indium Phosphide & Related Materials (IPRM); 2010, p1-4, 4p