المؤلفون: Li, L., Wattal, S., Nunn, J., Paden, J., Yan, J.

المصدر: IEEE Geoscience and Remote Sensing Letters IEEE Geosci. Remote Sensing Lett. Geoscience and Remote Sensing Letters, IEEE. 19:1-5 2022

المؤلفون: Li, L., Yan, J.-B., Gogineni, S., O'Neill, C., Dahl-Jensen, D., Simpson, C. D., Taylor, R., Elluru, D. N., Wattal, S., Nunn, J., Campbell, R. S., Steinhage, D., Miller, H., Eisen, O.

المصدر: IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, IGARSS 2020 - 2020 IEEE International. :1417-1419 Sep, 2020

Relation: IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium

المؤلفون: Yan, J.-B., Nunn, J., Gogineni, S., O'Neill, C., Simpson, C. D., Taylor, R., Li, L., Wattal, S., Yu, S., Steinhage, D., Dahl-Jensen, D., Miller, H., Eisen, O.

المصدر: IGARSS 2019 - 2019 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, IGARSS 2019 - 2019 IEEE International. :1001-1004 Jul, 2019

Relation: IGARSS 2019 - 2019 IEEE International Geoscience and Remote Sensing Symposium

المؤلفون: Yan, J., Li, L., Nunn, J.A., Dahl-Jensen, D., O'Neill, C., Taylor, R.A., Simpson, C.D., Wattal, S., Steinhage, D., Gogineni, P., Miller, H., Eisen, O.

المصدر: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing IEEE J. Sel. Top. Appl. Earth Observations Remote Sensing Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of. 13:2070-2080 2020

المؤلفون: Khan, A., Patel, K., Aurora, A., Raza, A., Parruck, B., Bagchi, A., Ghosh, A., Litinsky, B., Hong, E., Zhao, E., Ngo, J., Ko, K., Singh, L., Arnaudov, P., Wu, P., Ramakrishnan, R., Zecharia, R., Channabasappa, S., Kumar, S., Wattal, S., Wang, T., Joshi, U., Golan, Z., Zunning Luo, Le, D.-N., Ahmed, I., Chiu, F., Chow, K.Y., Furuzono, H., Ge, D., Min Li, Mueller, M., Nguyen, S., Nguyen, T., Saito, J., Shen, J., Todesco, A., Tsou, A., Demin Wang, Yang, S., Yu, J., Xia Zhong

المصدر: Proceedings of the IEEE 2003 Custom Integrated Circuits Conference, 2003. Custom integrated circuits Custom Integrated Circuits Conference, 2003. Proceedings of the IEEE 2003. :35-38 2003

Relation: CICC Custom Integrated Circuits Conference

المؤلفون: Chang, J.T.-Y., Chao-Wen Tseng, Yi-Chin Chu, Wattal, S., Partell, M., McCluskey, E.J.

المصدر: Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) VLSI test symposium VLSI Test Symposium, 1998. Proceedings. 16th IEEE. :118-123 1998

Relation: Proceedings 16th IEEE VLSI Test Symposium

المؤلفون: Franco, P., Ma, S., Chang, J., Yi-Chin Chu, Wattal, S., McCluskey, E.J., Stokes, R.L., Farwell, W.D.

المصدر: Proceedings International Test Conference 1996. Test and Design Validity International test conference Test Conference, 1996. Proceedings., International. :691-700 1996

Relation: Proceedings International Test Conference 1996. Test and Design Validity

المؤلفون: Wattal, S., Racherla, P., Mandviwalla, M.

المصدر: 2009 42nd Hawaii International Conference on System Sciences System Sciences, 2009. HICSS '09. 42nd Hawaii International Conference on. :1-10 Jan, 2009

Relation: 2009 42nd Hawaii International Conference on System Sciences (HICSS)

المؤلفون: Banker, R., Wattal, S., Fang-Chun Liu, Chin-Shyh Ou

المصدر: 2009 42nd Hawaii International Conference on System Sciences System Sciences, 2009. HICSS '09. 42nd Hawaii International Conference on. :1-10 Jan, 2009

Relation: 2009 42nd Hawaii International Conference on System Sciences (HICSS)

المؤلفون: Wattal, S., Telang, R., Mukhopadhyay, T.

المصدر: 2009 42nd Hawaii International Conference on System Sciences System Sciences, 2009. HICSS '09. 42nd Hawaii International Conference on. :1-10 Jan, 2009

Relation: 2009 42nd Hawaii International Conference on System Sciences (HICSS)