المؤلفون: Kobayashi, Haruo, Hirai, Manato, Otomo, Kakeru, Katayama, Shogo, Bai, Xueyan, Chiba, Masashi, Xu, Zifei, Yao, Dan, Nengvang, Lengkhang, Tran, Minh Tri, Yoshihiro, Kanji, Kuwana, Anna, Ooide, Takato, Tanimoto, Hiroshi, Gendai, Yuji, Wei, Jianglin

المصدر: 2023 IEEE 15th International Conference on ASIC (ASICON) ASIC (ASICON), 2023 IEEE 15th International Conference on. :1-4 Oct, 2023

Relation: 2023 IEEE 15th International Conference on ASIC (ASICON)

المؤلفون: Wei, Jianglin, Xiao, Guangyi, Peng, Shun, Chen, Hao, Guo, Jingzhi, Gong, Zhiguo

المصدر: 2023 IEEE International Conference on Multimedia and Expo (ICME) ICME Multimedia and Expo (ICME), 2023 IEEE International Conference on. :2693-2698 Jul, 2023

Relation: 2023 IEEE International Conference on Multimedia and Expo (ICME)

المؤلفون: Kobayashi, Haruo, Katoh, Kentaroh, Yamamoto, Shuhei, Zhao, Yujie, Katayama, Shogo, Wei, Jianglin, Yan, Yonglun, Yao, Dan, Bai, Xueyan, Kuwana, Anna

المصدر: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT), 2022 IEEE 16th International Conference on. :1-3 Oct, 2022

Relation: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

المؤلفون: Ogihara, Gaku, Nakatani, Takayuki, Iimori, Daisuke, Katayama, Shogo, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Zhao, Yujie, Wei, Jianglin, Hatayama, Kazumi, Kobayashi, Haruo

المصدر: 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Electronics, Circuits, and Systems (ICECS), 2021 28th IEEE International Conference on. :1-6 Nov, 2021

Relation: 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)

المؤلفون: Wei, Jianglin, Kuwana, Anna, Kobayashi, Haruo, Kubo, Kazuyoshi

المصدر: 2021 IEEE 14th International Conference on ASIC (ASICON) ASIC (ASICON), 2021 IEEE 14th International Conference on. :1-4 Oct, 2021

Relation: 2021 IEEE 14th International Conference on ASIC (ASICON)

المؤلفون: Kobayashi, Haruo, Bai, Xueyan, Zhao, Yujie, Yamamoto, Shuhei, Yao, Dan, Hirai, Manato, Wei, Jianglin, Katayama, Shogo, Kuwana, Anna

المصدر: 2021 IEEE 14th International Conference on ASIC (ASICON) ASIC (ASICON), 2021 IEEE 14th International Conference on. :1-4 Oct, 2021

Relation: 2021 IEEE 14th International Conference on ASIC (ASICON)

المؤلفون: Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jianglin, Nakatani, Takayuki, Zhao, Yujie, Katayama, Shogo, Yamamoto, Shuhei, Kuwana, Anna, Hatayama, Kazumi, Kobayashi, Haruo

المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :284-288 Oct, 2021

Relation: 2021 IEEE International Test Conference (ITC)

المؤلفون: Iimori, Daisuke, Nakatani, Takayuki, Katayama, Shogo, Ogihara, Gaku, Hatta, Akemi, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Wei, Jianglin, Zhao, Yujie, Tran, Tri Minh, Hatayama, Kazumi, Kobayashi, Haruo

المصدر: 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :364-373 Oct, 2021

Relation: 2021 IEEE International Test Conference (ITC)

المؤلفون: Wei, Jianglin, Kuwana, Anna, Kobayashi, Haruo, Kubo, Kazuyoshi, Tanaka, Yuuki

المصدر: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2021 IEEE International Midwest Symposium on. :774-778 Aug, 2021

Relation: 2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

المؤلفون: Yamamoto, Shuhei, Sasaki, Yuto, Zhao, Yujie, Wei, Jianglin, Kuwana, Anna, Sato, Keno, Ishida, Takashi, Okamoto, Toshiyuki, Ichikawa, Tamotsu, Nakatani, Takayuki, Tran, Tri Minh, Katayama, Shogo, Hatayama, Kazumi, Kobayashi, Haruo

المصدر: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2021 IEEE 27th International Symposium on. :1-6 Jun, 2021

Relation: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)