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1مؤتمر
المؤلفون: Yayla, Mikail, Thomann, Simon, Islam, Md Mazharul, Wei, Ming-Liang, Ho, Shu-Yin, Aziz, Ahmedullah, Yang, Chia-Lin, Chen, Jian-Jia, Amrouch, Hussam
المصدر: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-10 Apr, 2023
Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)
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2تقرير
المؤلفون: Yayla, Mikail, Thomann, Simon, Wei, Ming-Liang, Yang, Chia-Lin, Chen, Jian-Jia, Amrouch, Hussam
URL الوصول: http://arxiv.org/abs/2309.02111
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3مؤتمر
المؤلفون: Wei, Ming-Liang, Amrouch, Hussam, Sung, Cheng-Lin, Lue, Hang-Ting, Yang, Chia-Lin, Wang, Keh-Chung, Lu, Chih-Yuan
المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)
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4مؤتمر
المؤلفون: Wei, Ming-Liang, Lue, Hang-Ting, Ho, Shu-Yin, Lin, Yen-Po, Hsu, Tzu-Hsuan, Hsieh, Chih-Chang, Li, Yung-Chun, Yeh, Teng-Hao, Chen, Shih-Hung, Jhu, Yi-Hao, Li, Hsiang-Pang, Hu, Han-Wen, Hung, Chun-Hsiung, Wang, Keh-Chung, Lu, Chih-Yuan
المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :33.3.1-33.3.4 Dec, 2022
Relation: 2022 IEEE International Electron Devices Meeting (IEDM)
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5مؤتمر
المؤلفون: Lue, Hang-Ting, Fu, Chung-Hao, Hsu, Tzu-Hsuan, Wei, Ming-Liang, Yeh, Teng-Hao, Wang, Keh-Chung, Lu, Chih-Yuan
المصدر: 2022 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2022 IEEE. :1-2 Jun, 2022
Relation: 2022 IEEE Silicon Nanoelectronics Workshop (SNW)
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6مؤتمر
المؤلفون: Hsu, Po-Kai, Du, Pei-Ying, Lo, Chieh Roger, Lue, Hang-Ting, Chen, Wei-Chen, Hsu, Tzu-Hsuan, Yeh, Teng-Hao, Hsieh, Chih-Chang, Wei, Ming-Liang, Wang, Keh-Chung, Lu, Chih-Yuan
المصدر: 2020 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2020 IEEE International. :1-4 May, 2020
Relation: 2020 IEEE International Memory Workshop (IMW)
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7مؤتمر
المؤلفون: Sung, Cheng-Lin, Lue, Hang-Ting, Wei, Ming-Liang, Ho, Shu-Yin, Hu, Han-Wen, Du, Pei-Ying, Chen, Wei-Chen, Lo, Chieh Roger, Yeh, Teng-Hao, Wang, Keh-Chung, Lu, Chih-Yuan
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :21.3.1-21.3.4 Dec, 2020
Relation: 2020 IEEE International Electron Devices Meeting (IEDM)
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8مؤتمر
المؤلفون: Lue, Hang-Ting, Hsu, Po-Kai, Wei, Ming-Liang, Yeh, Teng-Hao, Du, Pei-Ying, Chen, Wei-Chen, Wang, Keh-Chung, Lu, Chih-Yuan
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :38.1.1-38.1.4 Dec, 2019
Relation: 2019 IEEE International Electron Devices Meeting (IEDM)
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9دورية أكاديمية
المؤلفون: Yang, Chen, Wang, Chen-Yu, Long, Qiao-Yun, Cao, Zhuo, Wei, Ming-Liang, Tang, Shan-Bo, Lin, Xiang, Mu, Zi-Qi, Xiao, Yong, Chen, Ming-Kai, Wu, Min, Li, Lian-Yun
المصدر: PLoS Pathogens; 6/3/2024, Vol. 20 Issue 6, p1-22, 22p
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10دورية أكاديمية
المؤلفون: Tsai, Yueh Lin, Wei, Ming Liang, Chien, Yu-Chen Chang, Chung, Yi-Ling, Cheng, Chao-Ming, Cho, Shu-Ling, Chen, Hsueh-Chih, Hu, Jon-Fan
المصدر: Proceedings of the Annual Meeting of the Cognitive Science Society. 36(36)
وصف الملف: application/pdf
URL الوصول: https://escholarship.org/uc/item/9kc448tz