المؤلفون: Gibson, M., Leske, S., Ward, R., Weir, B., Russell, K., Kolves, K.

المصدر: In Journal of Affective Disorders 1 June 2024 354:55-61

المؤلفون: Phanthavong, S., Daly, A.^{Aff2, IDs1331302200900w_cor2}, Weir, B., Lee, D., Park, D., Balmas, V., Burgess, L.

المصدر: Australasian Plant Pathology: Journal of the Australasian Plant Pathology Society. 52(1):23-26

المؤلفون: Alam, M., Weir, B., Silverman, P.

المصدر: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :30-34 2001

Relation: Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001

المؤلفون: Alam, M.A., Weir, B., Bude, J., Silverman, P., Monroe, D.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :449-452 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Alam, M.A., Bude, J., Weir, B., Silverman, P., Ghetti, A., Monroe, D., Cheung, K.P., Moccio, S.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :715-718 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Crous, P. W., Lombard, L., Sandoval-Denis, M., Seifert, K. A., Schroers, H-J, Chaverri, P., Gene, J., Guarro, J., Hirooka, Y., Bensch, K., Kema, G. H. J., Lamprecht, S. C., Cai, L., Rossman, A. Y., Stadler, M., Summerbell, R. C., Taylor, J. W., Ploch, S., Visagie, C. M., Yilmaz, N., Frisvad, J. C., Abdel-Azeem, A. M., Abdollahzadeh, J., Abdolrasouli, A., Akulov, A., Alberts, J. F., Araujo, J. P. M., Ariyawansa, H. A., Bakhshi, M., Bendiksby, M., Amor, A. Ben Hadj, Bezerra, J. D. P., Boekhout, T., Camara, M. P. S., Carbia, M., Cardinali, G., Castaneda-Ruiz, R. F., Celis, A., Chaturvedi, V, Collemare, J., Croll, D., Damm, U., Decock, C. A., de Vries, R. P., Ezekiel, C. N., Fan, X. L., Fernandez, N. B., Gaya, E., Gonzalez, C. D., Gramaje, D., Groenewald, J. Z., Grube, M., Guevara-Suarez, M., Gupta, V. K., Guarnaccia, V, Haddaji, A., Hagen, F., Haelewaters, D., Hansen, K., Hashimoto, A., Hernandez-Restrepo, M., Houbraken, J., Hubka, V, Hyde, K. D., Iturriaga, T., Jeewon, R., Johnston, P. R., Jurjevic, Z., Karalti, I, Korsten, L., Kuramae, E. E., Kusan, I, Labuda, R., Lawrence, D. P., Lee, H. B., Lechat, C., Li, H. Y., Litovka, Y. A., Maharachchikumbura, S. S. N., Marin-Felix, Y., Kemkuignou, B. Matio, Matocec, N., McTaggart, A. R., Mlcoch, P., Mugnai, L., Nakashima, C., Nilsson, R. H., Noumeur, S. R., Pavlov, I. N., Peralta, M. P., Phillips, A. J. L., Pitt, J. , I, Polizzi, G., Quaedvlieg, W., Rajeshkumar, K. C., Restrepo, S., Rhaiem, A., Robert, J., Robert, V, Rodrigues, A. M., Salgado-Salazar, C., Samson, R. A., Santos, A. C. S., Shivas, R. G., Souza-Motta, C. M., Sun, G. Y., Swart, W. J., Szoke, S., Tan, Y. P., Taylor, J. E., Taylor, P. W. J., Tiago, P. , V, Vaczy, K. Z., van de Wiele, N., van der Merwe, N. A., Verkley, G. J. M., Vieira, W. A. S., Vizzini, A., Weir, B. S., Wijayawardene, N. N., Xia, J. W., Yanez-Morales, M. J., Yurkov, A., Zamora, Juan Carlos, Zare, R., Zhang, C. L., Thines, M.

المصدر: Studies in mycology. (98)

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-458811
https://doi.org/10.1016/j.simyco.2021.100116
https://uu.diva-portal.org/smash/get/diva2:1612297/FULLTEXT01.pdf

المؤلفون: Jeffery, P., Ford, D., Pham, P., Reed, M., Srinivasan, N., Weir, B.

المصدر: Proceedings of Bipolar/Bicmos Circuits and Technology Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 1995., Proceedings of the 1995. :51-54 1995

Relation: Proceedings of Bipolar/Bicmos Circuits and Technology Meeting

المؤلفون: Alam, M., Weir, B., Silverman, A.

المصدر: IEEE Circuits and Devices Magazine IEEE Circuits Devices Mag. Circuits and Devices Magazine, IEEE. 18(2):42-48 Mar, 2002

المؤلفون: Timp, G., Agarwal, A., Baumann, F.H., Boone, T., Buonanno, M., Cirelli, R., Donnelly, V., Foad, M., Grant, D., Green, M., Gossmann, H., Hillenius, S., Jackson, J., Jacobson, D., Kleiman, R., Komblit, A., Klemens, F., Lee, J.T.-C., Mansfield, W., Moccio, S., Murrell, A., O'Malley, M., Rosamilia, J., Sapjeta, J., Silverman, P., Sorsch, T., Tai, W.W., Tennant, D., Vuong, H., Weir, B.

المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :930-932 1997

Relation: International Electron Devices Meeting. IEDM Technical Digest

المؤلفون: Ashton, R. A., Weir, B. E., Weiss, G., Meuse, T.

المصدر: 2004 Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.. :1-7 Sep, 2004

Relation: 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)