المؤلفون: Pham, D., Behnen, E., Bolliger, M., Hofstee, H.P., Johns, C., Kahle, J., Kameyama, A., Keaty, J., Le, B., Masubuchi, Y., Posluszny, S., Riley, M., Suzuoki, M., Wang, M., Warnock, J., Weitzel, S., Wendel, D., Yazawa, K.

المصدر: Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. Custom Integrated Circuits Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005. :45-49 2005

Relation: Proceedings of the IEEE 2005 Custom Integrated Circuits Conference

المؤلفون: Pham, D., Asano, S., Bolliger, M., Day, M.N., Hofstee, H.P., Johns, C., Kahle, J., Kameyama, A., Keaty, J., Masubuchi, Y., Riley, M., Shippy, D., Stasiak, D., Suzuoki, M., Wang, M., Warnock, J., Weitzel, S., Wendel, D., Yamazaki, T., Yazawa, K.

المصدر: 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :49-52 2005

Relation: 2005 International Conference on Integrated Circuit Design and Technology

المؤلفون: Warnock, J., Chan, Y., Huott, W., Carey, S., Fee, M., Wen, H., Saccamango, M. J., Malgioglio, F., Meaney, P., Plass, D., Chan, Y.-H., Mayo, M., Mayer, G., Sigal, L., Rude, D., Averill, R., Wood, M., Strach, T., Smith, H., Curran, B., Schwarz, E., Eisen, L., Malone, D., Weitzel, S., Mak, P.-K., McPherson, T., Webb, C.

المصدر: 2011 IEEE International Solid-State Circuits Conference Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International. :70-72 Feb, 2011

Relation: 2011 IEEE International Solid- State Circuits Conference - (ISSCC)

المؤلفون: Wendel, D. F., Kalla, R., Warnock, J., Cargnoni, R., Chu, S. G., Clabes, J. G., Dreps, D., Hrusecky, D., Friedrich, J., Islam, S., Kahle, J., Leenstra, J., Mittal, G., Paredes, J., Pille, J., Restle, P. J., Sinharoy, B., Smith, G., Starke, W. J., Taylor, S., Van Norstrand, A. J., Weitzel, S., Williams, P. G., Zyuban, V.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 46(1):145-161 Jan, 2011

المؤلفون: Chan, S. C., Restle, P. J., Bucelot, T. J., Liberty, J. S., Weitzel, S., Keaty, J. M., Flachs, B., Volant, R., Kapusta, P., Zimmerman, J. S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 44(1):64-72 Jan, 2009

المؤلفون: Pham, D.C., Aipperspach, T., Boerstler, D., Bolliger, M., Chaudhry, R., Cox, D., Harvey, P., Harvey, P.M., Hofstee, H.P., Johns, C., Kahle, J., Kameyama, A., Keaty, J., Masubuchi, Y., Pham, M., Pille, J., Posluszny, S., Riley, M., Stasiak, D.L., Suzuoki, M., Takahashi, O., Warnock, J., Weitzel, S., Wendel, D., Yazawa, K.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 41(1):179-196 Jan, 2006

المؤلفون: Stasiak, D., Chaudhry, R., Cox, D., Posluszny, S., Warnock, J., Weitzel, S., Wendel, D., Wang, M.

المصدر: IEEE Micro Micro, IEEE. 25(6):71-78 Jan, 2005

المؤلفون: Anderson, C.J., Petrovick, J., Keaty, J.M., Warnock, J., Nussbaum, G., Tendier, J.M., Carter, C., Chu, S., Clabes, J., DiLullo, J., Dudley, P., Harvey, P., Krauter, B., LeBlanc, J., Pong-Fei Lu, McCredie, B., Plum, G., Restle, P.J., Runyon, S., Scheuermann, M., Schmidt, S., Wagoner, J., Weiss, R., Weitzel, S., Zoric, B.

المصدر: 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) Solid-state circuits conference Solid-State Circuits Conference, 2001. Digest of Technical Papers. ISSCC. 2001 IEEE International. :232-233 2001

Relation: 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

المؤلفون: Franch, R., Restle, P., James, N., Huott, W., Friedrich, J., Dixon, R., Weitzel, S., Van Goor, K., Salem, G.

المصدر: 2008 IEEE International Test Conference Test Conference, 2008. ITC 2008. IEEE International. :1-7 Oct, 2008

Relation: 2008 IEEE International Test Conference (ITC)

المؤلفون: Franch, R., Restle, P., James, N., Huott, W., Friedrich, J., Dixon, R., Weitzel, S., Van Goor, K., Salem, G.

المصدر: 2007 IEEE International Test Conference Test Conference, 2007. ITC 2007. IEEE International. :1-7 Oct, 2007

Relation: 2007 IEEE International Test Conference