المؤلفون: Hao Li, Xue-Ying Fu, Jia-Fu Jiang, Rui-Xia Liu, Ran Li, Yuan-Chun Zheng, Wen-Jie Qi, Wei Liu, Wu-Chun Cao

المصدر: Emerging Microbes and Infections, Vol 6, Iss 1, Pp 1-3 (2017)

مصطلحات موضوعية: Infectious and parasitic diseases, RC109-216, Microbiology, QR1-502

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2222-1751

URL الوصول: https://doaj.org/article/a29558a11f104f7a93d4ae6356f73c2f

المؤلفون: Byoung Hun Lee, Choi, R., Kang, L., Gopalan, S., Nieh, R., Onishi, K., Jeon, Y., Wen-Jie Qi, Kang, C., Lee, J.C.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :39-42 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Kang, L., Onishi, K., Jeon, Y., Byoung Hun Lee, Kang, C., Wen-Jie Qi, Nieh, R., Gopalan, S., Choi, R., Lee, J.C.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :35-38 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Wen-Jie Qi, Nieh, R., Onishi, R., Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Gopalan, S., Lee, J.C.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :72-76 2000

Relation: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual

المؤلفون: Byoung Hun Lee, Laegu Kang, Wen-Jie Qi, Renee Nieh, Yongjoo Jeon, Katsunori Onishi, Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :133-136 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Wen-Jie Qi, Renee Nieh, Byoung Hun Lee, Laegu Kang, Yongjoo Jeon, Onishi, K., Ngai, T., Banerjee, S., Lee, J.C.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :145-148 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Yongjoo Jeon, Byoung Hun Lee, Zawadzki, K., Wen-Jie Qi, Lucas, A., Nieh, R., Lee, J.C.

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :797-800 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: Brennan, Bill, Pangrle, Suzette, Evans, Allen, Lu You, Min-Van Ngo, Wen Jie Qi, Baker, Ray, Won-Chong Baek, Romero, Jeremias, Stockwell, Winny, Tracy, Bryan

المصدر: 2007 International Symposium on Semiconductor Manufacturing Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on. :1-4 Oct, 2007

Relation: 2007 International Symposium on Semiconductor Manufacturing

المؤلفون: Easwar Dharmarajan, Shengnian Song, Mclaughlin, Lenore, Guan, John, Gazda, Jerzy, Lin, Emma, Wen-Jie Qi, Hidehiko Shiraiwa, Hussey, James, Lansford, Jeremy, Basab Banerjee

المصدر: 2007 International Symposium on Semiconductor Manufacturing Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on. :1-4 Oct, 2007

Relation: 2007 International Symposium on Semiconductor Manufacturing

المؤلفون: Laegu Kang, Byoung Hun Lee, Wen-Jie Qi, Yongjoo Jeon, Nieh, R., Gopalan, S., Onishi, K., Lee, J.C.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(4):181-183 Apr, 2000