المؤلفون: Eichstadt S, Tang JY, Solis DC, Siprashvili Z, Marinkovich MP, Whitehead N, Schu M, Fang F, Erickson SW, Ritchey ME, Colao M, Spratt K, Shaygan A, Ahn MJ, Sarin KY

المصدر: Clinical, Cosmetic and Investigational Dermatology, Vol Volume 12, Pp 933-942 (2019)

مصطلحات موضوعية: dystrophic epidermolysis bullosa, genotype, phenotype, incidence, prevalence, Dermatology, RL1-803

وصف الملف: electronic resource

Relation: https://www.dovepress.com/from-clinical-phenotype-to-genotypic-modelling-incidence-and-prevalenc-peer-reviewed-article-CCID; https://doaj.org/toc/1178-7015

URL الوصول: https://doaj.org/article/e8080e94bdec4a2d8796a1872a75f3cf

المؤلفون: Eichstadt S, Tang JY, Solis DC, Siprashvili Z, Marinkovich MP, Whitehead N, Schu M, Fang F, Erickson SW, Ritchey ME, Colao M, Spratt K, Shaygan A, Ahn MJ, Sarin KY

المصدر: Clinical, Cosmetic and Investigational Dermatology, Vol Volume 14, Pp 679-680 (2021)

مصطلحات موضوعية: dystrophic epidermolysis bullosa, genotype, phenotype, incidence, prevalence, Dermatology, RL1-803

وصف الملف: electronic resource

Relation: https://www.dovepress.com/corrigendum-from-clinical-phenotype-to-genotypic-modelling-incidence-a-peer-reviewed-fulltext-article-CCID; https://doaj.org/toc/1178-7015

URL الوصول: https://doaj.org/article/80c6969baf0e40718d7611d588cb8147

المؤلفون: Whitehead, N. E.^Aff12, Ulusoy, Ü.^Aff13

المساهمون: di Prisco, Marco, Series Editor^Aff1, Chen, Sheng-Hong, Series Editor^Aff2, Vayas, Ioannis, Series Editor^Aff3, Kumar Shukla, Sanjay, Series Editor^Aff4, Sharma, Anuj, Series Editor^Aff5, Kumar, Nagesh, Series Editor^Aff6, Wang, Chien Ming, Series Editor^Aff7, Cui, Zhen-Dong, Series Editor^Aff8, Erberik, Murat Altug, editor^Aff9, Askan, Aysegul, editor^Aff10, Kockar, Mustafa Kerem, editor^Aff11

المصدر: Proceedings of the 7th International Conference on Earthquake Engineering and Seismology : 7ICEES 2023—Volume 2. 401:591-608

المؤلفون: Whitehead, N. Peter, Adams, Stephen C., Scherer, William T., Kang, Hyojung, Gerber, Matthew

المصدر: 2017 Annual IEEE International Systems Conference (SysCon) Systems Conference (SysCon), 2017 Annual IEEE International. :1-8 Apr, 2017

Relation: 2017 Annual IEEE International Systems Conference (SysCon)

المؤلفون: Whitehead, N. J., Horsley, S. A. R., Philbin, T. G., Kruglyak, V. V.

المصدر: Phys. Rev. B 100, 094404 (2019)

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/1906.09985

المؤلفون: Whitehead, N. Peter, Scherer, William T.

المصدر: 2015 Annual IEEE Systems Conference (SysCon) Proceedings Systems Conference (SysCon), 2015 9th Annual IEEE International. :44-49 Apr, 2015

Relation: 2015 9th Annual IEEE International Systems Conference (SysCon)

المؤلفون: Whitehead, N. J., Horsley, S. A. R., Philbin, T. G., Kruglyak, V. V.

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/1807.06705

المؤلفون: Whitehead, N. J., Horsley, S. A. R., Philbin, T. G., Kuchko, A. N., Kruglyak, V. V.

المصدر: Phys. Rev. B 96, 064415 (2017)

مصطلحات موضوعية: Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/1705.01852

المؤلفون: Whitehead, N. Peter, Scherer, William T.

المصدر: 2013 IEEE International Systems Conference (SysCon) Systems Conference (SysCon), 2013 IEEE International. :317-324 Apr, 2013

Relation: 2013 7th Annual IEEE Systems Conference (SysCon)

المؤلفون: Whitehead, N. P., Scherer, W. T., Louis, G. L., Smith, M. C.

المصدر: 2010 IEEE Green Technologies Conference Green Technologies Conference, 2010 IEEE. :1-9 Apr, 2010

Relation: 2010 IEEE Green Technologies Conference (IEEE-Green-2010)