المؤلفون: Pedreira, O. Varela, Stucchi, M., Gupta, A., Gonzalez, V. Vega, van der Veen, M., Lariviere, S., Wilson, C.J., Tokei, Zs, imec, K. Croes

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-7 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Lesniewska, A., Roussel, P.J., Tierno, D., Gonzalez, V. Vega, van der Veen, M. H., Verdonck, P., Jourdan, N., Wilson, C.J., Tokei, Zs., Croes, K.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020

Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Gupta, A., Pedreira, O.V., Arutchelvan, G., Zahedmanesh, H., Devriendt, K., Mertens, H., Tao, Z., Ritzenthaler, R., Wang, S., Radisic, D., Kenis, K., Teugels, L., Sebai, F., Lorant, C., Jourdan, N., Chan, B.T., Subramanian, S., Schleicher, F., Hopf, T., Peter, A.P., Rassoul, N., Debruyn, H., Demonie, I., Siew, Y.K., Chiarella, T., Briggs, B., Zhou, X., Rosseel, E., De Keersgieter, A., Capogreco, E., Litta, E.D., Boccardi, G., Baudot, S., Mannaert, G., Bontemps, N., Sepulveda, A., Mertens, S., Kim, M., Dupuy, E., Vandersmissen, K., Paolillo, S., Yakimets, D., Chehab, B., Favia, P., Drijbooms, C., Cousserier, J., Jaysankar, M., Lazzarino, F., Morin, P., Altamirano, E., Mitard, J., Wilson, C.J., Holsteyns, F., Boemmels, J., Demuynck, S., Tokei, Z., Horiguchi, N.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5349-5354 Dec, 2020

المؤلفون: Ciofi, I., Roussel, P.J., Wilson, C.J., Croes, K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(4):1737-1744 Apr, 2020

المؤلفون: Ciofi, I., Roussel, P.J., Baert, R., Contino, A., Gupta, A., Croes, K., Wilson, C.J., Mocuta, D., Tokei, Z.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(5):2339-2345 May, 2019

المؤلفون: Binks, J.A., Wilson, C.J., Van Schaik, P., Eaves, D.L.

المصدر: In Psychology of Sport & Exercise September 2023 68

المؤلفون: Adelmann, C., Sankaran, K., Dutta, S., Gupta, A., Kundu, S., Jamieson, G., Moors, K., Pinna, N., Ciofi, Ivan, Van Eishocht, S., Bommels, J., Boccardi, G., Wilson, C.J., Pourtois, G., Tokei, Z.

المصدر: 2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :154-156 Jun, 2018

Relation: 2018 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Ciofi, I., Roussel, P.J., Saad, Y., Moroz, V., Hu, C., Baert, R., Croes, K., Contino, A., Vandersmissen, K., Gao, W., Matagne, P., Badaroglu, M., Wilson, C.J., Mocuta, D., Tokei, Z.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(5):2306-2313 May, 2017

المؤلفون: Croes, K., Adelmann, Ch., Wilson, C.J., Zahedmanesh, H., Pedreira, O. Varela, Wu, C., Lesniewska, A., Oprins, H., Beyne, S., Ciofi, I., Kocaay, D., Stucchi, M., Tokei, Zs.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :5.3.1-5.3.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Croes, K., Wilson, C.J., Lofrano, M., Vereecke, B., Beyer, G.P., Tokei, Zs.

المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :591-598 May, 2010

Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)