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1دورية أكاديمية
المؤلفون: Tamar van Gardingen-Cromwijk, Sander Konijnenberg, Wim Coene, Manashee Adhikary, Teus Tukker, Stefan Witte, Johannes F. de Boer, Arie den Boef
المصدر: Light: Advanced Manufacturing, Vol 4, Iss 4, Pp 453-465 (2024)
مصطلحات موضوعية: lens aberrations, non-isoplanatism, digital holographic microscopy, metrology, computational imaging, Manufactures, TS1-2301, Applied optics. Photonics, TA1501-1820
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2689-9620
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المؤلفون: Tamar van Gardingen-Cromwijk, Manashee Adhikary, Christos Messinis, Sander Konijnenberg, Wim Coene, Stefan Witte, Johannes F. de Boer, Arie den Boef
المساهمون: LaserLaB - Physics of Light, Atoms, Molecules, Lasers, LaserLaB - Biophotonics and Microscopy, Biophotonics and Medical Imaging
المصدر: van Gardingen-Cromwijk, T, Adhikary, M, Messinis, C, Konijnenberg, S, Coene, W, Witte, S, de Boer, J F & Den Boef, A 2023, ' Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrology ', Optics Express, vol. 31, no. 1, pp. 411-425 . https://doi.org/10.1364/OE.476157
van Gardingen-Cromwijk, T, Adhikary, M, Messinis, C, Konijnenberg, S, Coene, W, Witte, S, de Boer, J F & den Boef, A 2023, ' Field-position dependent apodization in dark-field digital holographic microscopy for semiconductor metrology ', Optics Express, vol. 31, no. 1, pp. 411-425 . https://doi.org/10.1364/OE.476157
Optics Express, 31(1), 411-425. The Optical Societyمصطلحات موضوعية: Atomic and Molecular Physics, and Optics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ddc652e57da043bec7ad573ac9173c2
https://hdl.handle.net/1871.1/eeecf63e-25a0-4df9-9e45-ecc09009340a -
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المؤلفون: Maxim Tschernajew, Steffen Hädrich, Robert Klas, Martin Gebhardt, Roland Horsten, Sven Weerdenburg, Sergey Pyatchenkov, Wim Coene, Sven Breitkopf, Oliver Herrfurth, Jan Rothhardt, Tino Eidam, Jens Limpert
المصدر: Optica High-brightness Sources and Light-driven Interactions Congress 2022.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::67d89bc716984db985e32daad16cf047
https://doi.org/10.1364/euvxray.2022.eth3a.3 -
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المؤلفون: Sven Weerdenburg, Yifeng Shao, Jacob Seifert, Roland Horsten, Wim Coene
المصدر: Optica High-brightness Sources and Light-driven Interactions Congress 2022.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::04b5d42de2f5ca6c8ae2abc67c2e4211
https://doi.org/10.1364/euvxray.2022.ew4a.2 -
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المؤلفون: Maxim Tschernajew, Steffen Haedrich, Robert Klas, Martin Gebhardt, Roland Horsten, Sven Weerdenburg, Sergey Pyatchenkov, Wim Coene, Christian Gaida, Sven Breitkopf, Jan Rothhardt, Tino Eidam, Jens Limpert
المصدر: Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XXI.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::89a9396165a0bb123ea8288aa4f35a38
https://doi.org/10.1117/12.2577496 -
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المؤلفون: Wmjm Wim Coene, Mbi Michel Habets, Siep Weiland, Rwh Ruben Merks
المساهمون: Control Systems, Control of high-precision mechatronic systems, Spatial-Temporal Systems for Control, Cyber-Physical Systems Center Eindhoven
المصدر: Imaging and Applied Optics 2015
مصطلحات موضوعية: Wavefront, Physics, Optics, business.industry, Extreme ultraviolet lithography, Multiphysics, Thermal, Actuator, business, Deformable mirror
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::08074560f8900cb6988fa6f61678e95e
https://doi.org/10.1364/aoms.2015.aom4b.2 -
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المؤلفون: N. Kumar, H. P. Urbach, Silvania F. Pereira, Wmjm Wim Coene, V.G. Kutchoukov, Roy Sarathi, O. El Gawhary
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Diffraction, symbols.namesake, Optics, Fourier transform, business.industry, symbols, Deconvolution, Grating, business, Rigorous coupled-wave analysis, Fourier series, Coherence (physics), Metrology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8e6f71f1d61588563f1148ed5921cfcd
https://doi.org/10.1117/12.916357 -
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المؤلفون: Phl Peter Notten, Wmjm Wim Coene, Jlc Daams, Ref Einerhand, F. Hakkens
المساهمون: Electromechanics and Power Electronics
المصدر: Philosophical Magazine A : physics of condensed matter, structure, defects and mechanical properties, 65(6), 1485-1502. Taylor and Francis Ltd.
مصطلحات موضوعية: Diffraction, Reflection high-energy electron diffraction, Physics and Astronomy (miscellaneous), Gas electron diffraction, Chemistry, Metals and Alloys, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Crystallography, Electron diffraction, Transmission electron microscopy, X-ray crystallography, General Materials Science, Powder diffraction, Electron backscatter diffraction
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