المؤلفون: Jinrong, Song, Diwei, Fan, Winter, Wang, Gaojie, Wen, Li, Tian, Changyan, Qi

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :189-192 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Diwei Fan, Li Tian, Miao Wu, Chunlei Wu, Winter Wang, Gaojie Wen

المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :87-90 Jul, 2013

Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Chunlei Wu, Suying Yao, Gaojie Wen, Li Tian, Miao Wu, Diwei Fan, Winter Wang

المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :445-448 Jul, 2013

Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Gaojie Wen, Binghai Liu, Winter Wang, Jinglong Li, Li Tian, Xuezhu Wang

المصدر: 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2011 18th IEEE International Symposium on the. :1-4 Jul, 2011

Relation: 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011)

المؤلفون: Wu Chunlei, Linda Zhai, Masuda Motohiko, Horse Ma, Winter Wang, John Liu, Jonathon Liu

المصدر: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the. :1-4 Jul, 2010

Relation: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)

المؤلفون: Wu Chunlei, Linda Zhai, Winter Wang, Grace Song, Li Jinglong, Yu Joe, Masuda Motohiko

المصدر: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2010 17th IEEE International Symposium on the. :1-6 Jul, 2010

Relation: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)

المؤلفون: Power Tian, Haus Zhang, Jinrong Song, Chi He, Winter Wang

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: Amplitude, Optics, Materials science, Optical probing, business.industry, Optical frequencies, Thermal, Integrated optics, Thermal analysis, business, Optical switch, Intensity (physics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18cd69cfa9b4fc63a01df7c7e85c8a5b
https://doi.org/10.1109/ipfa.2018.8452556

المؤلفون: Gaojie Wen, Bird Fan, Jon Ren, Winter Wang, Xiaocui Li

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: business.industry, Computer science, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Integrated circuit, urologic and male genital diseases, 021001 nanoscience & nanotechnology, Chip, 01 natural sciences, law.invention, 010309 optics, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0210 nano-technology, business, Computer hardware

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ffdc20aa36801b9751fddd6399e9643c
https://doi.org/10.1109/ipfa.2018.8452524

المؤلفون: Ran Chen, Xiaocui Li, Winter Wang, Haus Zhang

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: 010302 applied physics, Computer science, Digital-to-analog converter, Schematic, Mixed-signal integrated circuit, 02 engineering and technology, Root cause, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, Crosstalk, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static random-access memory, 0210 nano-technology, Failure mode and effects analysis, Self test

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d4b3361eec1f005186288684e1d727a4
https://doi.org/10.1109/ipfa.2018.8452580

المؤلفون: Power Tian, Winter Wang, Haus Zhang, Xuejian Qian

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, media_common.quotation_subject, Functional failure, 02 engineering and technology, Integrated circuit, 01 natural sciences, 020202 computer hardware & architecture, law.invention, Electrical isolation, Debugging, Optical probing, law, Optical frequencies, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Isolation (database systems), business, Failure mode and effects analysis, media_common

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::adbf3163ada5b1c55a31f6a64ed4c377
https://doi.org/10.1109/ipfa.2017.8060131