المؤلفون: Jiseong Lee, Min Joon Kim, Woo-Seop Kim, Yong Sin Kim

المصدر: IEEE Access, Vol 11, Pp 124782-124796 (2023)

مصطلحات موضوعية: Correctable error (CE), error correction code (ECC), memory reliability, availability, serviceability (RAS), uncorrectable error (UE), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10308581/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/f3c8bcd72ca64c5f88a4458e208e9f23

المؤلفون: Kyu-hyoun Kim, Uksong Kang, Hoe-Ju Chung, Duk-Ha Park, Woo-Seop Kim, Young-Chan Jang, Moonsook Park, Hoon Lee, Jin-Young Kim, Jung Sunwoo, Hwan-Wook Park, Hyun-Kyung Kim, Su-Jin Chung, Jae-Kwan Kim, Hyung-Seuk Kim, Kee-Won Kwon, Young-Taek Lee, Joo Sun Choi, Changhyun Kim

المصدر: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :527-536 2006

Relation: 2006 IEEE International Solid State Circuits Conference

المؤلفون: Kyu-hyoun Kim, Young-Soo Sohn, Chan-Kyoung Kim, Moonsook Park, Dong-Jin Lee, Woo-Seop Kim, Changhyun Kim

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 41(1):127-134 Jan, 2006

المؤلفون: Jin-Hyun Kim, Sua Kim, Woo-Seop Kim, Jung-Hwan Choi, Hong-Sun Hwang, Changhyun Kim, Suki Kim

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 40(1):89-101 Jan, 2005

المؤلفون: Kennedy, J., Mooney, R., Ellis, R., Jaussi, J., Borkar, S., Jung-Hwan Choi, Jae-Kwan Kim, Chan-Kyong Kim, Woo-Seop Kim, Chang-Hyun Kim, Soo-In Cho, Loeffler, S., Hoffmann, J., Hokenmaier, W., Houghton, R., Vogelsang, T.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 40(1):233-244 Jan, 2005

المؤلفون: Woo-Seop Kim, Lok-Won Kim, Chang-Eun Lee, Kyeong-Deok Moon, Suki Kim

المصدر: IEEE Transactions on Consumer Electronics IEEE Trans. Consumer Electron. Consumer Electronics, IEEE Transactions on. 48(3):650-655 Aug, 2002

المؤلفون: Uksong Kang, Hoe-Ju Chung, Seongmoo Heo, Soon-Hong Ahn, Hoon Lee, Soo-Ho Cha, Jaesung Ahn, DukMin Kwon, Jin Ho Kim, Jae-Wook Lee, Han-Sung Joo, Woo-Seop Kim, Hyun-Kyung Kim, Eun-Mi Lee, So-Ra Kim, Keum-Hee Ma, Dong-Hyun Jang, Nam-Seog Kim, Man-Sik Choi, Sae-Jang Oh, Jung-Bae Lee, Tae-Kyung Jung, Jei-Hwan Yoo, Changhyun Kim

المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. :130-131,131a Feb, 2009

Relation: 2009 IEEE International Solid-State Circuits Conference - (ISSCC)

المؤلفون: Ki-Whan Song, Hoon Jeong, Jae-Wook Lee, Sung In Hong, Nam-Kyun Tak, Young-Tae Kim, Yong Lack Choi, Han Sung Joo, Sung Hwan Kim, Ho Ju Song, Yong Chul Oh, Woo-Seop Kim, Yeong-Taek Lee, Kyungseok Oh, Changhyun Kim

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Hoeju Chung, Youngchan Jang, Youngdon Choi, Park, Hwanwook, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Park, Moonsook, Hyungwsuk Kim, Sang-Yun Kim, Hyun-Kyung Kim, Su-Jin Chung, Eun-Mi Lee, Youngju Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Changhyun Kim

المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :29-32 Nov, 2008

Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Sua Kim, Bae-Sun Kong, Chil-gi Lee, Jin-Hyun Kim, Woo-Seop Kim, Young-Hyun Jun, Changhyun Kim

المصدر: 2005 IEEE Asian Solid-State Circuits Conference Asian Solid-State Circuits Conference, 2005. :53-56 Nov, 2005

Relation: 2005 IEEE Asian Solid-State Circuits Conference