المؤلفون: Chang, W., Tsou, T., Lin, T.H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4062-4066 Aug, 2023

المؤلفون: Cao, L., Zhang, Q., Luo, Y., Gu, J., Gan, W., Lu, P., Yao, J., Xu, H., Zhao, P., Luo, K., Wu, Y., Bu, W., Wu, Z., Yin, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(11):5971-5977 Nov, 2022

المؤلفون: Chen, Y., Huang, B., Cheng, C., Hsieh, W., Tsai, C., Tu, C., Liu, Y., Liu, C.W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(7):3611-3616 Jul, 2022

المؤلفون: Chang, W., Li, M., Hsu, C., Lin, W., Yeh, W.

المصدر: IEEE Open Journal of Nanotechnology IEEE Open J. Nanotechnol. Nanotechnology, IEEE Open Journal of. 2:72-77 2021

المؤلفون: Hou, Zhao-Zhao, Yin, Hua-Xiang, Wu, Zhen-Hua

المصدر: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2018 14th IEEE International Conference on. :1-3 Oct, 2018

Relation: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

المؤلفون: Srinivasan, P., Ranjan, R., Cimino, S., Zainuddin, A., Kannan, B., Pantisano, L., Mahmud, I., Dilliway, G., Nigam, T.

المصدر: 2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :6F.2-1-6F.2-5 Mar, 2018

Relation: 2018 IEEE International Reliability Physics Symposium (IRPS)

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Wen-Teng Chang, Meng-His Li, Chun-Hao Hsu, Wen-Chin Lin, Wen-Kuan Yeh

المصدر: IEEE Open Journal of Nanotechnology, Vol 2, Pp 72-77 (2021)

مصطلحات موضوعية: Work function metal, threshold voltage tuning, energy-dispersive X-ray spectroscopy, FinFETs, reliability, Chemical technology, TP1-1185, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9528922/; https://doaj.org/toc/2644-1292

URL الوصول: https://doaj.org/article/1891743a4eaa498f96f6e993d8118506

المؤلفون: Yoon, J., Jeong, J., Lee, S., Baek, R.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 6:861-865 2018

المؤلفون: Chen, Y.-T., Fu, S.-I., Chiang, W.-T., Lin, C.-T., Tsai, S.-H., Wang, S.-W., Chang, S.-J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(7):946-948 Jul, 2012