يعرض 1 - 10 نتائج من 475 نتيجة بحث عن '"Wouters, Y."', وقت الاستعلام: 0.98s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Growth of a Single MnCr2O4 Spinel on Ni–25Cr–1.5Mn Alloy by the Rhines Pack Method and Photoelectrochemical and Raman Signatures of MnCr2O4 Spinel

    المؤلفون: Perez, T., Mathieu, S.Aff1, IDs11085024102694_cor2, Latu-Romain, L., Wouters, Y., Vilasi, M.

    المصدر: High Temperature Corrosion of Materials: Formerly Oxidation of Metals. :1-11

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  2. 2
    دورية أكاديمية
    Superior vena cava syndrome in chronic intestinal failure patients: When the going gets tough

    المؤلفون: Gillis, V.E.L.M., Korzilius, J.W., Wouters, Y., Jenniskens, S.F.M., Wanten, G.J.A.

    المصدر: In Clinical Nutrition January 2024 43(1):197-202

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  3. 3
    دورية أكاديمية
    Onto the role of copper precipitates and reverted austenite on hydrogen embrittlement in 17-4 PH stainless steel

    المؤلفون: Schutz, P., Latu-Romain, L., Martin, F., Auzoux, Q., Adem, J., Wouters, Y., Ravat, B., Menut, D.

    المصدر: In Materials Characterization August 2023 202

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  4. 4
    دورية أكاديمية
    Hydrogen transport in 17−4 PH stainless steel: Influence of the metallurgical state on hydrogen diffusion and trapping

    المؤلفون: Schutz, P., Martin, F., Auzoux, Q., Adem, J., Rauch, E.F., Wouters, Y., Latu-Romain, L.

    المصدر: In Materials Characterization October 2022 192

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  5. 5
    مؤتمر
    Study of void formation in Cu interconnects using local sense and standard singlevia structure

    المؤلفون: Marti, G., Arnaud, L., Wouters, Y.

    المصدر: IEEE International Interconnect Technology Conference Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International. :121-124 May, 2014

    Relation: 2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC)

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  6. 6
    دورية أكاديمية
    Should Gold Marker or TEM-ASTAR Characterization Be Used to Determine Oxide Growth Direction?

    المؤلفون: Latu-Romain, L.Aff1, Aff2, Roy, T., Perez, T., Parsa, Y., Aranda, L., Podor, R., Mathieu, S., Vilasi, M., Wouters, Y.

    المصدر: Oxidation of Metals. 96(3-4):201-211

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  7. 7
    مؤتمر
    Effects of current density on electromigration resistance trace analysis

    المؤلفون: Bana, F., Arnaud, L., Ney, D., Galand, R., Wouters, Y.

    المصدر: 2011 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2011 IEEE International. :59-62 Oct, 2011

    Relation: 2011 IEEE International Integrated Reliability Workshop (IIRW)

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  8. 8
    مؤتمر
    Effect of reservoir on electromigration of short interconnects

    المؤلفون: Lamontagne, P., Ney, D., Wouters, Y.

    المصدر: 2010 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report (IRW), 2010 IEEE International. :46-50 Oct, 2010

    Relation: 2010 IEEE International Integrated Reliability Workshop (IIRW)

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  9. 9
    مؤتمر
    Resistance trace modeling and electromigration immortality criterion based on void growth saturation

    المؤلفون: Lamontagne, P., Ney, D., Doyen, L., Petitprez, E., Wouters, Y.

    المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :922-925 May, 2010

    Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

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  10. 10
    مؤتمر
    Improved statistical analysis at low failure rates in Cu electromigration using an innovative multilink test structure

    المؤلفون: Bana, F., Ney, D., Arnaud, L., Wouters, Y.

    المصدر: 2012 IEEE International Interconnect Technology Conference Interconnect Technology Conference (IITC), 2012 IEEE International. :1-3 Jun, 2012

    Relation: 2012 IEEE International Interconnect Technology Conference - IITC

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