يعرض 1 - 10 نتائج من 98 نتيجة بحث عن '"Wu, Guo-Wei"', وقت الاستعلام: 1.01s تنقيح النتائج
  1. 1
    مؤتمر
    Low-temperature solder for low-carbon emitting process

    المؤلفون: Wang, Yi-Wun, Liang, Hua-Tui, Tseng, Tzu-Ting, Wu, Guo-Wei

    المصدر: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) Electronics Packaging Technology Conference (EPTC), 2023 IEEE 25th. :231-234 Dec, 2023

    Relation: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)

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  2. 2
    دورية أكاديمية
    Uncovering neural pathways underlying bulimia nervosa: resting-state neural connectivity disruptions correlate with maladaptive eating behaviors

    المؤلفون: Wang, Jia-ni, Wang, Miao, Wu, Guo-wei, Li, Wei-hua, Lv, Zi-lingAff4, Aff5, Chen, Qian, Yang, Zheng-han, Li, Xiao-hongAff4, Aff5, Wang, Zhen-chang, Li, Zhan-jiangAff4, Aff5, IDs40519023016175_cor10, Zhang, PengAff1, IDs40519023016175_cor11, Tang, Li-rongAff4, Aff5, IDs40519023016175_cor12

    المصدر: Eating and Weight Disorders - Studies on Anorexia, Bulimia and Obesity. 28(1)

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  3. 3
    دورية أكاديمية
    Study on the growth mechanisms of Cu-In compounds at the Sn52In/Cu interface

    المؤلفون: Wang, Yi-WunAff1, Aff2, IDs10854023113470_cor1, Wu, Guo-Wei

    المصدر: Journal of Materials Science: Materials in Electronics. 34(29)

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  4. 4
    دورية أكاديمية
    Partial Segregation of Bi and Microvoid Formation on a Pure Cu Substrate After Solid–Solid Reactions

    المؤلفون: Wang, Yi-WunAff1, Aff2, IDs11664023103901_cor1, Liang, Hua-Tui, Chang, Kai-Chia, Wu, Guo-Wei, Tseng, Tzu-Ting, Chen, Yi

    المصدر: Journal of Electronic Materials. 52(6):4000-4010

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  5. 5
    دورية أكاديمية
    Resolving measurement ambiguity in diffractive image microscopy for 6DOF surface measurement using designed aberration and multiple-layer perceptron

    المؤلفون: Wu, Guo-Wei, Chen, Liang-ChiaAff1, IDs00170023111470_cor2

    المصدر: The International Journal of Advanced Manufacturing Technology. 126(1-2):583-592

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  6. 6
    مؤتمر
    The minimizing prediction error on corporate financial distress forecasting model: An application of dynamic distress threshold value

    المؤلفون: Chiou, Kuo-Ching, Lo, Ming-Min, Wu, Guo-Wei

    المصدر: 2017 IEEE 8th International Conference on Awareness Science and Technology (iCAST) Awareness Science and Technology (iCAST), 2017 IEEE 8th International Conference on. :514-517 Nov, 2017

    Relation: 2017 8th International Conference on Awareness Science and Technology (iCAST)

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  7. 7
    دورية أكاديمية
    Microstructural observation of Bi67In reacting with Cu for microelectronic interconnects

    المؤلفون: Wang, Yi-Wun, Tseng, Tzu-Ting, Chang, Kai-Chia, Wu, Guo-Wei, Liang, Hua-Tui

    المصدر: In Journal of the Taiwan Institute of Chemical Engineers October 2023 151

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  8. 8
    دورية أكاديمية
    Non-integral depth measurement of high-aspect-ratio multi-layer microstructures using numerical-aperture shaped beams

    المؤلفون: Chein, Wei-Hsin, Yang, Fu-Sheng, Thakur, Komal, Wu, Guo-Wei, Chen, Liang-Chia

    المصدر: In Optics and Lasers in Engineering July 2023 166

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  9. 9
    مؤتمر
    Body effect of SiGe and CESL strained nano-node NMOSFETs on (100) silicon substrate

    المؤلفون: Wang, Mu-Chun, Wu, Guo-Wei, Wang, Shea-Jue, Yang, Hsin-Chia, Liao, Wen-Shiang, Lu, Ming-Feng, Jhang, Jing-Zong, Liu, Chuan-Hsi

    المصدر: 2013 International Symposium on Next-Generation Electronics Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on. :379-382 Feb, 2013

    Relation: 2013 International Symposium on Next-Generation Electronics (ISNE)

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  10. 10
    مؤتمر
    Probing moving charge distribution of biaxial and CESL strained PMOSFETs with body effect

    المؤلفون: Wang, Mu-Chun, Jhang, Jing-Zong, Wang, Shea-Jue, Yang, Hsin-Chia, Liao, Wen-Shiang, Lu, Ming-Feng, Wu, Guo-Wei, Liu, Chuan-Hsi

    المصدر: 2013 International Symposium on Next-Generation Electronics Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on. :375-378 Feb, 2013

    Relation: 2013 International Symposium on Next-Generation Electronics (ISNE)

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