المؤلفون: Ehwald, K.E., Fischer, A., Fuernhammer, F., Winkler, W., Senapati, B., Barth, R., Bolze, D., Heinemann, B., Knoll, D., Ruecker, H., Schmidt, D., Shevchenko, I., Sorge, R., Wulf, H.-E.

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :121-124 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

المؤلفون: Knoll, D., Heinemann, B., Barth, R., Blum, K., Borngraber, J., Drews, J., Ehwald, K.-E., Fischer, G., Fox, A., Grabolla, T., Haak, U., Hoppner, W., Korndorfer, F., Kuck, B., Marschmeyer, S., Richter, H., Rucker, H., Schley, P., Schmidt, D., Scholz, R., Senapati, B., Tillack, B., Winkler, W., Wolansky, D., Wolf, C., Wulf, H.-E., Yamamoto, Y., Zaumseil, P.

المصدر: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :241-244 2004

Relation: Proceedings of the 2004 Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Heinemann, B., Rucker, H., Barth, R., Bauer, J., Bolze, D., Bugiel, E., Drews, J., Ehwald, K.-E., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Kruger, D., Kuck, B., Kurps, R., Marschmeyer, M., Richter, H.H., Schley, P., Schmidt, D., Scholz, R., Tillack, B., Winkler, W., Wolnsky, D., Wulf, H.-E., Yamamoto, Y., Zaumseil, P.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :775-778 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Sorge, R., Fischer, A., Ehwald, K.-E., Barth, R., Ostrovsky, P., Pliquett, R., Schulz, K., Bolze, D., Schley, P., Schmidt, D., Wulf, H.-E., Grutzediek, H., Scheerer, J., Hartmetz, P.

المصدر: 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems Silicon Monolithic Integrated Circuits in RF Systems, 2008. SiRF 2008. IEEE Topical Meeting on. :58-61 Jan, 2008

Relation: 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

المؤلفون: Rucker, H., Heinemann, B., Barth, R., Bauer, J., Blum, K., Bolze, D., Drews, J., Fischer, G.G., Fox, A., Fursenko, O., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Kopke, K., Kuck, B., Mai, A., Marschmeyer, S., Morgenstern, T., Richter, H.H., Schley, P., Schmidt, D., Schulz, K., Tillack, B., Weidner, G., Winkler, W., Wolansky, D., Wulf, H.-E., Yamamototo, Y.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :651-654 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Knoll, D., Heinemann, B., Ehwald, K. E., Fox, A., Rucker, H., Barth, R., Bolze, D., Grabolla, T., Haak, U., Drews, J., Kuck, B., Marschmeyer, S., Richter, H. H., Chaimanee, M., Fursenko, O., Schley, P., Tillack, B., Kopke, K., Yamamoto, Y., Wulf, H. E., Wolansky, D.

المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

Relation: 2006 International Electron Devices Meeting

المؤلفون: Rucker, H., Heinemann, B., Barth, R., Bolze, D., Drews, J., Haak, U., Hoppner, W., Knoll, D., Kopke, K., Marschmeyer, S., Richter, H.H., Schley, P., Schmidt, D., Scholz, R., Tillack, B., Winkler, W., Wulf, H.-E., Yamamoto, Y.

المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :5.3.1-5.3.4 2003

Relation: IEEE International Electron Devices Meeting 2003

المؤلفون: Heinemann, B., Knoll, D., Barth, R., Bolze, D., Blum, K., Drews, J., Ehwald, K.-E., Fischer, G.G., Kopke, K., Kruger, D., Kurps, R., Rucker, H., Schley, P., Winkler, W., Wulf, H.-E.

المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :15.6.1-15.6.4 2001

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Winkler, W, Borngräber, J, Heinemann, B, Rücker, H, Barth, R, Bauer, J, Bolze, D, Drews, J, Ehwald, K.-E, Grabolla, T, Haak, U, Höppner, W, Knoll, D, Krüger, D, Kuck, B, Kurps, R, Marschmeyer, M, Richter, H, Schley, P, Schmidt, D, Scholz, R, Tillack, B, Wolansky, D, Wulf, H.-E, Yamamoto, Y, Zaumseil, P

المصدر: In Applied Surface Science 2004 224(1):297-305

المؤلفون: Ehwald, K.E., Fischer, A., Fuernhammer, F., Winkler, W., Senapati, B., Barth, R., Bolze, D., Heinemann, B., Knoll, D., Ruecker, H., Schmidt, D., Shevchenko, I., Sorge, R., Wulf, H.-E.

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850); 2004, p121-124, 4p