يعرض 1 - 10 نتائج من 10 نتيجة بحث عن '"Wuu, Jen-Yi"', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    مؤتمر
    Post-placement lithographic hotspot detection and removal in one-dimensional gridded designs

    المؤلفون: Wuu, Jen-Yi, Simmons, Mark, Marek-Sadowska, Malgorzata

    المصدر: Thirteenth International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2012 13th International Symposium on. :193-199 Mar, 2012

    Relation: 2012 13th International Symposium on Quality Electronic Design (ISQED)

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  2. 2
    مؤتمر
    Metrics for characterizing machine learning-based hotspot detection methods

    المؤلفون: Wuu, Jen-Yi, Pikus, Fedor G., Marek-Sadowska, Malgorzata

    المصدر: 2011 12th International Symposium on Quality Electronic Design Quality Electronic Design (ISQED), 2011 12th International Symposium on. :1-6 Mar, 2011

    Relation: 2011 International Symposium on Quality Electronic Design (ISQED)

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  3. 3
    مؤتمر
    Rapid layout pattern classification

    المؤلفون: Wuu, Jen-Yi, Pikus, Fedor G., Torres, Andres, Marek-Sadowska, Malgorzata

    المصدر: 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011) Design Automation Conference (ASP-DAC), 2011 16th Asia and South Pacific. :781-786 Jan, 2011

    Relation: 2011 16th Asia and South Pacific Design Automation Conference ASP-DAC 2011

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  4. 4
    مؤتمر
    Detecting context sensitive hot spots in standard cell libraries.

    المؤلفون: Wuu, Jen-Yi, Pikus, Fedor G., Torres, Andres, Marek-Sadowska, Malgorzata

    المصدر: Proceedings of SPIE; Nov2009, Issue 1, p727515-727515-9, 9p

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  5. 5
    مؤتمر
    Fast and simple modeling of non-rectangular transistors.

    المؤلفون: Wuu, Jen-Yi, Pikus, Fedor G., Marek-Sadowska, Malgorzata

    المصدر: Proceedings of SPIE; Nov2008 Part 2, Issue 1, p71223S-71223S-10, 10p

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  6. 6
    مؤتمر
    SoC test scheduling using the B-tree based floorplanning technique.

    المؤلفون: Wuu, Jen-Yi, Chen, Tung-Chieh, Chang, Yao-Wen

    المصدر: Proceedings of the 2005 Asia & South Pacific Design Automation Conference; 1/18/2005, p1188-1191, 4p

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  7. 7
    مؤتمر
    Stochastic defect criticality prediction enabled by physical stochastic modeling and massive metrology.

    المؤلفون: Felix, Nelson M., Lio, Anna, Wang, ChangAn, Cao, Peigen, Delorme, Maxence, Wuu, Jen-Yi, Fu, Jiyou, Wang, Fuming, Lin, Bob, Zhao, Yiqiong, Peng, Yi-Hsing, Fan, Yongfa, Feng, Mu, Cheng, Bin, Wang, Jen-Shiang, Simmoms, Mark, Hunsche, Stefan, Patterson, Oliver, Pao, Kuo-Feng, Elmalk, Abdalmohsen

    المصدر: Proceedings of SPIE; 11/2/2020, Vol. 11609, p1160916-1160916, 1p

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  8. 8
    دورية
    Efficient approach to early detection of lithographic hotspots using machine learning systems and pattern matching

    المؤلفون: Wuu, Jen-Yi, Pikus, Fedor G., Marek-Sadowska, Malgorzata

    المصدر: Proceedings of SPIE; March 2011, Vol. 7974 Issue: 1 p79740U-79740U-8, 717669p

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  9. 9
    دورية
    Stochastic defect criticality prediction enabled by physical stochastic modeling and massive metrology

    المؤلفون: Felix, Nelson M., Lio, Anna, Wang, ChangAn, Cao, Peigen, Delorme, Maxence, Wuu, Jen-Yi, Fu, Jiyou, Wang, Fuming, Lin, Bob, Zhao, Yiqiong, Peng, Yi-Hsing, Fan, Yongfa, Feng, Mu, Cheng, Bin, Wang, Jen-Shiang, Simmoms, Mark, Hunsche, Stefan, Patterson, Oliver, Pao, Kuo-Feng, Elmalk, Abdalmohsen, Gao, Kevin, Fei, Ruochong, Zeng, Xuefeng, Zhang, Xiaolong

    المصدر: Proceedings of SPIE; February 2021, Vol. 11609 Issue: 1 p1160916-1160916-9

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  10. 10
    دورية
    Layout optimization through robust pattern learning and prediction in SADP gridded designs

    المؤلفون: Wuu, Jen-Yi, Simmons, Mark, Marek-Sadowska, Malgorzata

    المصدر: Proceedings of SPIE; March 2012, Vol. 8327 Issue: 1 p832705-832705-7

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