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1مؤتمر
المؤلفون: Wuudiann Ke, Khoan Truong
المصدر: AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360) ASICs ASICs, 1999. AP-ASIC '99. The First IEEE Asia Pacific Conference on. :307-310 1999
Relation: Proceedings of AP-ASIC'99: The First IEEE Asia-Pacific Conference on ASICs
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2مؤتمر
المؤلفون: Wuudiann Ke
المصدر: Proceedings International Test Conference 1996. Test and Design Validity International test conference Test Conference, 1996. Proceedings., International. :717-724 1996
Relation: Proceedings International Test Conference 1996. Test and Design Validity
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3مؤتمر
المؤلفون: Wuudiann Ke, Duy Le, Jarwala, N.
المصدر: Proceedings of 1995 IEEE International Test Conference (ITC) International test conference Test Conference, 1995. Proceedings., International. :789-796 1995
Relation: Proceedings of 1995 IEEE International Test Conference (ITC)
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4دورية أكاديمية
المؤلفون: Wuudiann Ke, Menon, P.R.
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 14(5):576-582 May, 1995
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5مؤتمر
المؤلفون: Wuudiann Ke, Seth, S., Bhattacharya, B.B.
المصدر: [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on. :166-169 1988
Relation: 1988 IEEE International Conference on Computer-Aided Design
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6
المؤلفون: Wuudiann Ke, P. R. Menon
المصدر: Journal of Electronic Testing. 6:333-336
مصطلحات موضوعية: Combinational logic, Path delay, Test set, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Electrical and Electronic Engineering, Fault (power engineering), Testability, Hardware_LOGICDESIGN, Electronic circuit, Mathematics, Reliability engineering
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7
المؤلفون: P.R. Menon, Wuudiann Ke
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 14:576-582
مصطلحات موضوعية: Combinational logic, Finite-state machine, Sequential logic, Design for testing, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Fault (power engineering), Computer Graphics and Computer-Aided Design, law.invention, Logic synthesis, law, Path (graph theory), Electrical and Electronic Engineering, Algorithm, Software, Hardware_LOGICDESIGN, Mathematics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a3411f4f7229cdf55a0d48058ed7e99
https://doi.org/10.1109/43.384419
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8
المؤلفون: Khoan Truong, Wuudiann Ke
المصدر: AP-ASIC'99. First IEEE Asia Pacific Conference on ASICs (Cat. No.99EX360).
مصطلحات موضوعية: Engineering, Iterative design, Computer architecture, business.industry, Design for testing, Circuit design, Design flow, Integrated circuit design, Physical design, Design methods, business, Software engineering, Testability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::94fda477694441682ac71496a17a1d16
https://doi.org/10.1109/apasic.1999.824090 -
9
المؤلفون: Bhargab B. Bhattacharya, Sharad C. Seth, Wuudiann Ke
المصدر: ICCAD
مصطلحات موضوعية: Stuck-at fault, Combinational logic, Simulation algorithm, Criticality, Computer science, Graph (abstract data type), Graph theory, Fault model, Data structure, Algorithm
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b0ae81167048001e0b6945835d4ac72d
https://doi.org/10.1109/iccad.1988.122486 -
10
المؤلفون: Wuudiann Ke
المصدر: ITC
مصطلحات موضوعية: Engineering, Boundary scan, Backplane, business.industry, Embedded system, Fault coverage, System testing, Automatic test pattern generation, business, Data structure, Synchronization, Computer hardware, Test data
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::62c47801ff375f0cebf6144489f525f8
https://doi.org/10.1109/test.1996.557130
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